Universal test connector for connecting a SATA or USB data storage device to a data storage device tester

[0001] A huge market exists for data storage devices, such as data storage devices with Serial Advanced Technology Attachment (SATA) interfaces (such as SATA data storage devices) or Universal Serial Bus (USB) interfaces (such as USB data storage devices), for mass-market computing devices such as desktop computers and laptop computers. To be competitive, a SATA or USB data storage device should be relatively inexpensive and provide reliable performance.

[0002] To ensure reliability, USB and SATA data storage devices typically undergo a variety of testing during data storage device manufacturing. Such testing is typically carried out in a data storage device tester that includes multiple cells into which the data storage devices are loaded and unloaded such that a sequential series of tests and procedures can be administered to the loaded data storage devices. However, due to differences between USB and SATA interface connectivity, a data storage device tester for testing a USB data storage device requires a different type of connector than a tester for testing a SATA data storage device.

[0012] The present disclosure is directed to a universal test connector and data storage device tester (such as a disk drive tester) comprising one or more universal test connectors. The universal test connector is used for connecting a Serial Advanced Technology Attachment (SATA) data storage device (such as a SATA disk drive) including a SATA interface connector and a plurality of serial input/output (SIO) contacts or a Universal Serial Bus (USB) data storage device (such as a USB disk drive) including a USB interface connector, a plug connector, and a plurality of SIO contacts to the data storage device tester. In an embodiment, the universal test connector includes a receptacle connector, a cross-member, and a plurality of SIO contacts.

[0013] When the universal test connector is connected to a USB data storage device, the receptacle connector is connected to the plug connector on the USB data storage device, the cross-member conforms around the USB interface connector, and the SIO contacts on the test connector are connected to the SIO contacts on the USB data storage device. Alternatively, when the universal test connector is connected to a SATA data storage device, the receptacle connector is connected to the SATA interface connector and the SIO contacts on the test connector are connected to the SIO contacts on the SATA data storage device. In an embodiment, the universal test connector further includes blind mate plugs that are configured for blind mating into corresponding receptacles on the USB data storage device or the SATA data storage device.

[0014] Certain embodiments of the invention will now be described. These embodiments are presented by way of example only, and are not intended to limit the scope of the invention. Various omissions, substitutions and changes in the form of the universal test connector and data storage device tester described herein may be made without departing from the spirit of the invention. To illustrate some of the embodiments, reference will now be made to the figures.

[0015] FIG. 1 shows a data storage device tester 100 according to an embodiment of the present invention comprising a plurality of cells 102, 103, wherein each cell comprises a universal test connector 104 and a backplane printed circuit board (PCB) 106. The data storage device tester 100 provides tests and procedures for data storage devices comprising a SATA interface and connector (SATA data storage device) or a USB interface and connector (USB data storage device) as required in a data storage device manufacturing process. The data storage devices include, for example, disk drives (such as USB 2.0, USB 3.0, or SATA disk drives), solid state devices (SSD) (each comprising non-volatile semiconductor memory (NVSM) (such as flash memory)), and hybrid devices (each comprising a disk drive and NVSM (such as flash memory)). The tests and procedures provided by the data storage device tester 100 may include, for example, media scanning, defect discovery, read channel optimization, and standard back-end test processing as known in the art.

[0016] It is noted that the data storage device tester 100 shown in FIG. 1 has only two cells for the sake of simplicity in illustrating the invention; however, as can be appreciated by one of ordinary skill in the art, the data storage device tester may include a large number of cells as required in an efficient high volume data storage device manufacturing process (such as a high volume disk drive manufacturing process).

[0017] As shown in FIG. 1, each universal test connector 104 comprises a receptacle connector 108, a cross-member 110, and a plurality of SIO contacts 112 and is configured to connect to a USB (e.g., USB 2.0 or USB 3.0) data storage device (such as a USB 2.0 or USB 3.0 disk drive) or a SATA data storage device (such as a SATA disk drive). In one embodiment, each of the SIO contacts comprises a spring-loaded contact, wherein the spring-loaded contact is depressed by a corresponding contact on a USB or SATA data storage device when the test connector 104 is connected to the data storage device. In the embodiment shown in FIG. 1, the universal test connector 104 comprises two SIO contacts 112. In one embodiment, the universal test connector comprises more than two SIO contacts.

[0018] In the embodiment shown in FIG. 1, the universal test connector further comprises blind mate plugs 114, 116 for blind mating into a SATA or USB data storage device. When the test connector is connected to a SATA or USB data storage device, the blind mate plugs on the test connector are inserted into corresponding receptacles on the SATA or USB data storage device. The receptacle connector 108 further comprises a portion of a standard SATA 15-pin power receptacle. In an embodiment, the receptacle connector 108 comprises a 12-pin portion of the standard SATA power receptacle. In the embodiment shown in FIG. 1, the SIO contacts 112, the cross-member 110, the blind mate plugs 114, 116, and the receptacle connector 108 are in alignment.

[0019] When the test connector 104 is connected to a USB data storage device (such as a USB 2.0 or 3.0 data storage device) comprising a USB interface connector, a plug connector, and a plurality of SIO contacts, the receptacle connector 108 is connected to the plug connector, the cross-member 110 conforms around the USB interface connector, and the SIO contacts 112 on the test connector are connected to the SIO contacts on the USB data storage device. The receptacle connector 108 comprises a plurality of contacts (not shown in FIG. 1) for providing power to the USB data storage device via corresponding contacts on plug connector. The SIO contacts 112 on the test connector 104 provide serial communication between the data storage device tester 100 and the USB data storage device via the SIO contacts on the USB data storage device. In one embodiment, the receptacle connector 108 further comprises SIO contacts for providing serial communication between the tester 100 and the USB data storage device via corresponding SIO contacts on the plug connector. In an embodiment, the SIO contacts on the receptacle connector 108 are connected to the SIO contacts on the test connector 104 via traces on the backplane PCB 106.

[0020] When the test connector 104 is connected to a SATA data storage device comprising a SATA interface connector and a plurality of SIO contacts, the receptacle connector 108 is connected to the SATA interface connector and the SIO contacts 112 on the test connector 104 are connected to the corresponding SIO contacts on the SATA data storage device. The plurality of power contacts (not shown in FIG. 1) on the receptacle connector 108 provide power to the SATA data storage device via corresponding power contacts on SATA interface connector. The SIO contacts 112 on the test connector 104 provide serial communication between the data storage device tester 100 and the SATA data storage device via the SIO contacts on the SATA data storage device.

[0021] FIG. 2 shows a perspective view of data storage device tester 100 in FIG. 1 with a plurality of data storage devices loaded therein according to an embodiment of the present invention. As shown in FIG. 2, respective data storage devices 117, 119 are loaded into respective cells 102, 103, wherein each data storage device is connected to the data storage device tester 100 via a universal test connector 104 (shown in FIG. 1) in each cell. The data storage devices 117, 119 may comprise, for example, SATA data storage devices or USB data storage devices (such as USB 2.0 or 3.0 data storage devices).

[0022] FIG. 3A shows a perspective view of a universal test connector 104 comprising a receptacle connector 108, a cross-member 110, a plurality of SIO contacts 112, and blind mate plugs 114, 116 according to an embodiment of the present invention. As shown in FIG. 3A, one blind mate plug 114 is situated between the cross-member 110 and the SIO contacts 112 and the receptacle connector 108 is situated between the other blind mate plug 116 and the cross-member 110. Thus, in the embodiment shown in FIG. 3A, the cross-member 110 and the receptacle connector 108 are situated between the blind mate plugs 114, 116.

[0023] As shown in FIG. 3A, the receptacle connector 108 comprises an opening 118 on the frontside of the test connector 104 for receiving a plug connector on a USB data storage device. In the embodiment shown in FIG. 3A, the opening 118 in the receptacle connector 108 is in alignment with the cross-member 110 and the blind mate plugs 114, 116. The receptacle connector 108 further comprises a plurality of contacts 120 for supplying power to a SATA or USB data storage device, wherein the contacts 120 are situated on a lower inside surface 121 of the receptacle connector 108 and are accessible through the opening 118 in the receptacle connector 108.

[0024] As shown in FIG. 3A, the universal test connector 104 further comprises a plurality of contacts 122 situated on the backside of the test connector 104 and underlying the receptacle connector 108, wherein the backside contacts 122 are connected, respectively, to the contacts 120 situated on the lower inner surface 121 of the receptacle connector 108. The backside contacts 122 are configured for connection to the backplane PCB 106 in each cell 102, 103 of the data storage device tester 100 (shown in FIG. 1). For example, the backside contacts 122 may be connected to the backplane PCB 106 (shown in FIG. 1) by soldering the contacts 122 to traces on the backplane PCB 106.

[0025] In an embodiment of the invention shown in FIG. 3A, the test connector 104 further comprises a tabs 124, 126 (shown clearly in FIG. 3B) for securing the test connector 104 to the backplane PCB 106 in each cell of the data storage device tester 100. The tabs 124, 126 are situated at opposing ends of the test connector 104 and may be secured to the backplane PCB 106 by using, for example, solder, epoxy, or other adhesive material. In one embodiment, the tabs 124, 126 are not used.

[0026] As shown in FIG. 3A, an edge 128 of the receptacle connector 108, the cross-member 110, and the blind mate plug 114 adjacent to the SIO contacts 112 define a substantially U-shaped space 130 on the test connector 104 for receiving a USB interface connector on a USB data storage device (such as a USB 2.0 or 3.0 data storage device). When the test connector 104 is connected to a SATA data storage device, a power portion of the SATA interface connector on the SATA data storage device extends into the substantially U-shaped space 130.

[0027] FIG. 3B shows another perspective view of the universal test connector 104 according to an embodiment of the present invention.

[0028] FIG. 4A shows a perspective view of a universal test connector according to an embodiment of the present invention. In FIG. 4A, the universal test connector 404 comprises a receptacle connector 430, a cross-member 110, a plurality of SIO contacts 112, blind mate plugs 114, 116, and tabs 124, 126. In the embodiment in FIG. 4A, the receptacle connector 430 comprises a plurality of SIO contacts 432 situated on an upper inner surface 434 of the receptacle connector 430, in addition to a plurality of contacts 120 (shown in FIG. 3A) situated on an opposing lower inner surface 121 of the receptacle connector 430.

[0029] In the embodiment shown in FIG. 4A, the SIO contacts 432 on the upper inner surface 434 of the receptacle connector 430 provide serial communication between a data storage device tester 100 (shown in FIGS. 1, 2) and a USB data storage device (such as a USB 2.0 or 3.0 data storage device) via corresponding SIO contacts on a plug connector in the USB data storage device. In an embodiment, the SIO contacts 432 on the upper inner surface 434 of the receptacle connector 430 provide serial communication between the data storage device tester 100 (shown in FIGS. 1, 2) and a SATA data storage device via corresponding SIO contacts on the SATA interface connector in the SATA data storage device. In an embodiment, the SIO contacts 432 in the receptacle connector 430 are connected to the SIO contacts 112 on the test connector 404 via traces on the backplane PCB 106 (shown in FIG. 1).

[0030] FIG. 4B shows another perspective view of the universal test connector 404 according to an embodiment of the present invention.

[0031] FIG. 5 shows a perspective view of a universal test connector and a USB 3.0 data storage device according to an embodiment of the present invention. In the embodiment shown in FIG. 5, the USB 3.0 data storage device 502 comprises a USB 3.0 interface connector 504, a plug connector 506, a plurality of SIO contacts 508, and blind mate receptacles 510 and 512. When the test connector 104 is connected to the USB 3.0 data storage device 502, the receptacle connector 108 is connected to the plug connector 506, the substantially U-shaped space 130 (defined by edge 121 of the receptacle connector 108, cross-member 110, and blind mate plug 114) receives the USB 3.0 interface connector 510, the cross-member 110 conforms around the USB 3.0 interface connector 510, and the SIO contacts 112 on the test connector are connected to the SIO contacts 508 on the USB 3.0 data storage device. Also, when the test connector 104 is connected to the USB 3.0 data storage device 502, the blind mate plugs 114, 112 on the test connector are inserted into the corresponding blind mate receptacles 510, 512 on the USB 3.0 data storage device 502, thereby enabling the USB 3.0 data storage device to blind mate into the test connector.

[0032] As shown in FIG. 5, the test connector 104 comprises a plurality of SIO contacts 514 situated on the backside of the test connector 104, wherein the backside SIO contacts are connected, respectively, to the SIO contacts 112 situated on the frontside of the test connector 104. The backside SIO contacts 514 are connected to the backplane PCB 106 in the data storage device tester 100 (shown in FIG. 1), thereby providing a connection between the frontside SIO contacts 112 and the data storage device tester.

[0033] In the embodiment shown in FIG. 5, when the USB 3.0 data storage device 502 is connected to the data storage device tester 100 (shown in FIGS. 1, 2), power is provided from the data storage device tester 100 to the USB 3.0 data storage device 502 via the receptacle connector 108 and the plug connector 506, and SIO communication is provided between the data storage device tester 100 and the USB 3.0 data storage device via the SIO contacts 112 on the test connector 104 and the SIO contacts 508 on the USB 3.0 data storage device. In an embodiment in which the test connector 404 (shown in FIGS. 4A, 4B) comprises a receptacle connector 430 (shown in FIGS. 4A, 4B) comprising SIO contacts 432, SIO communication is provided between the data storage device tester 100 and the USB 3.0 data storage device 502 via the SIO contacts 432 (shown in FIG. 4A) on the receptacle connector 430 and corresponding SIO contacts on the plug connector 506 on the USB 3.0 data storage device.

[0034] FIG. 6 shows a perspective view of a universal test connector and a USB 2.0 data storage device according to an embodiment of the present invention. In the embodiment shown in FIG. 6, the USB 2.0 data storage device 602 comprises a USB 2.0 interface connector 604, a plug connector 606, a plurality of SIO contacts 608, and blind mate receptacles 610, 612. When the test connector 104 is connected to the USB 2.0 data storage device 602, the receptacle connector 108 on the test connector is connected to the plug connector 606, the substantially U-shaped space 130 (defined by edge 121 of the receptacle connector 108, cross-member 110, and blind mate plug 114) receives the USB 2.0 interface connector 610, the cross-member 110 conforms around the USB 2.0 interface connector 610, and SIO contacts 112 on the test connector are connected to corresponding SIO contacts 608 on the USB 2.0 data storage device. Also, when the test connector 104 is connected to the USB 2.0 data storage device 602, the blind mate plugs 114, 112 on the test connector are inserted into the corresponding blind mate receptacles 610, 612 on the USB 3.0 data storage device 602, thereby enabling the USB 2.0 data storage device to blind mate into the test connector 104.

[0035] In the embodiment shown in FIG. 6, when the USB 2.0 data storage device 602 is connected to the data storage device tester 100 (shown in FIGS. 1, 2), power is provided from the data storage device tester 100 to the USB 2.0 data storage device 602 via the receptacle connector 108 and the plug connector 606, and SIO communication is provided between the data storage device tester 100 and the USB 2.0 data storage device via SIO contacts 112 on the test connector 104 and corresponding SIO contacts 608 on the USB 2.0 data storage device. In an embodiment in which the test connector 404 (shown in FIGS. 4A, 4B) comprises a receptacle connector 430 (shown in FIGS. 4A, 4B) comprising SIO contacts 432, SIO communication is provided between the data storage device tester 100 and the USB 2.0 data storage device 602 via the SIO contacts 432 and corresponding SIO contacts on the plug connector 606 on the USB 2.0 data storage device.

[0036] FIG. 7 shows a perspective view of a universal test connector and a SATA data storage device according to an embodiment of the present invention. In the embodiment shown in FIG. 7, the SATA data storage device 702 comprises a SATA interface connector 704 comprising a power portion 705 and an I/O signal portion, a plurality of SIO contacts 708, and blind mate receptacles 710, 712. When the test connector 104 is connected to the SATA data storage device 702, the receptacle connector 108 is connected to the power portion 705 of the SATA interface connector 704 and the power portion 705 extends into the substantially U-shaped space 130 (defined by edge 121 of the receptacle connector 108, cross-member 110, and blind mate plug 114), and SIO contacts 112 on the test connector are connected to corresponding SIO contacts 708 on the SATA data storage device. Also, when the test connector 104 is connected to the SATA data storage device 702, the blind mate plugs 114, 112 on the test connector are inserted into the corresponding blind mate receptacles 710, 712 on the SATA data storage device 702, thereby enabling the SATA data storage device to blind mate into the test connector 104.

[0037] In the embodiment shown in FIG. 7, when the SATA data storage device 702 is connected to the data storage device tester 100 (shown in FIGS. 1, 2), power is provided from the data storage device tester 100 to the SATA data storage device 702 via the receptacle connector 108 and the power portion 705 of the SATA interface connector 704, and SIO communication is provided between the data storage device tester 100 and the SATA data storage device via SIO contacts 112 on the test connector 104 and corresponding SIO contacts 708 on the SATA data storage device. In an embodiment in which the test connector 404 (shown in FIGS. 4A, 4B) comprises a receptacle connector 430 (shown in FIGS. 4A, 4B) comprising SIO contacts 432, SIO communication is provided between the data storage device tester 100 and the SATA data storage device 702 via the SIO contacts 432 in the test connector 404 and corresponding SIO contacts on the power portion 705 of the SATA interface connector 704 on the SATA data storage device.

[0038] The features and attributes of the specific embodiments disclosed above may be combined in different ways to form additional embodiments, all of which fall within the scope of the present disclosure. Although certain embodiments have been disclosed, other embodiments that are apparent to those of ordinary skill in the art, including embodiments which do not provide all of the features and advantages set forth herein, are also within the scope of this disclosure. Accordingly, the scope of protection is defined only by the claims.