US 7,342,665 B2Grant
System and method for control of paint thickness
Issue Date:2008-03-11
•25 Claims
•5 Drawing Sheets
Abstract
The invention is directed to a system and method for implementing process control for paint thickness using sonic NDE techniques. The system may, for example, generate ultrasound waves in a test object during the manufacturing process. A detector such as an interferometer may be used to detect the ultrasound waves. An interpreter or analyzer may determine the thickness and or presence of a defect from the waves. Further, the interpreter may associate the thickness measurement and/or defect with a location about an object. Then, a control system may determine and implement an appropriate control action on the process. The control action may also be associated with the location about the object.
Metadata
Inventor
- Thomas E. Drake, Jr.
Application Information
Application Number:US 10/142,071
Filing Date:2002-05-09
Priority Date:1998-06-30
Art Unit:2877
Classifications
IPC:
G01B9/02
Patent Drawings (5 sheets)
Description
Related Applications
[0001] This application claims the benefit of, incorporates by reference, and is a Continuation-In-Part of Non-Provisional Patent Application Ser. No. 09/416,399 filed on Oct. 12, 1999, now U.S. Pat. No. 6,657,733, entitled “METHOD AND APPARATUS FOR DETECTING ULTRASONIC SURFACE DISPLACEMENTS USING POST COLLECTION OPTICAL AMPLIFICATION” to Thomas E. Drake. Non-Provisional Patent Application Ser. No. 09/416,399 in turn claims benefit to U.S. Provisional Application No. 60/091,229 filed on Jun. 30, 1998. This application incorporates by reference the prior U.S. Provisional Application No. 60/091,240 filed on Jun. 30, 1998 entitled “METHOD AND APPARATUS FOR ULTRASONIC LASER TESTING” to Thomas E. Drake. This application is related to and incorporates by reference: Non-Provisional Patent Application Ser. No. 10/142,072, filed on May 9, 2002, entitled “SYSTEM AND METHOD FOR CONTROL OF PAPER ELASTICITY AND THICKNESS” to Thomas E. Drake; Non-Provisional Patent Application Ser. No. 10/142,073 entitled “SYSTEM AND METHOD FOR CONTROLLING TUBE THICKNESS” to Thomas E. Drake; and Non-Provisional Patent Application Ser. No. 10/142,178, filed on May 9, 2002, entitled “SYSTEM AND METHOD FOR CONTROLLING WAFER TEMPERATURE”.
Technical Field of the Invention
[0002] This invention relates in general to non-destructive examination techniques. More specifically, the invention relates to control using ultrasound testing methods for determining paint thickness.
Background of the Invention
[0003] Non-destructive examination (NDE) of objects may be used to test for defects in manufactured parts. NDE provides a method of examination that limits damage the tested part. As such, parts may be examined before they are placed in service. Further, used parts may be examined for flaw or defects resulting from use.
[0004] However, many typical NDE techniques are slow. Further, the results of the tests are difficult to interpret and typically require an human observer. Typically, these techniques require a human observer to perform analysis. Therefore, the techniques are not automated.
[0005] These typical techniques may also require contact with the surface of the tested part. In many processes, parts or objects are moving through the process at great speeds. In other processes, contact with the part or object may be limited because of drying or annealing surface films. Further, contact with the part may be limited by other process variables.
[0006] As such, these techniques are not suitable for use in process control. The slow testing time may not provide enough information for process control applications. Further, a lack of automation in the analyzing the results limits applicability to process control. In addition, contact with the part may not be suitable, preventing the technique from use in the process.
[0007] For example, a manufacturing process may include painting a part. As the paint is dying or annealing, typical methods which require physical contact with the part may not be used. In addition, typical techniques may not detect the thickness of multiple layers of paint Further, these typical methods may require interpretation by a user. As such, these methods may not be used for control of painting process.
[0008] As such, many typical NDE techniques suffer from deficiencies in speed and automation. Many other problems and disadvantages of the prior art will become apparent to one skilled in the art after comparing such prior art with the present invention as described herein.
Summary of the Invention
[0009] Aspects of the invention may be found in an apparatus for determining the thickness of paint and/or determining the existence of defects in a thin film region. The apparatus may have a sonic energy generator, one or more detectors and an interpreter. The sonic energy generator may, for example, be a laser generator directing a beam of coherent electromagnetic energy at an object. From the impinging energy, sonic energy waves may be generated about the object or along the surface of the object, among others. The one or more detectors may detect and/or measure the sonic energy waves. An interpreter may then be used to determine the thickness of the paint and/or the existence of defects. Further, the thickness or defect may be associated with a location about the object.
[0010] Aspects of the invention may also be found in a method for determining the thickness of paint and/or determining the existence of defects in the thin film region. Sonic energy waves may be generated about a test object using a sonic energy generator. The sonic energy waves may be detected and/or measured by a sonic energy detector. The thickness or existence of defects may be determined by an interpreter. Further, the thickness or defect may be associated with a location about the object.
[0011] Another aspects of the invention may be found in an apparatus for process control of paint thickness or defect reduction. The apparatus may have a sonic energy generator, one or more detectors, and a control system. The sonic energy generator may, for example, be a laser generator directing a beam of coherent electromagnetic energy at an object. From the impinging energy, sonic energy waves may be generated about the object or along the surface of the object, among others. The one or more detectors may detect and/or measure the sonic energy waves. The control system may determine what action may be taken to achieve and/or maintain an aspect of the object near or about a set point. Further, the thickness or defect may be associated with a location about the object and the action may be associated with processing of the object in that location.
[0012] A further aspects of the invention may be found in a method for process control of paint thickness or defect reduction. Sonic energy waves may be generated about a test object using a sonic energy generator. The sonic energy waves may be detected and/or measured by a sonic energy detector. An action may be determined, which may achieve and/or maintain an aspect of the object near or about a set point. Further, the thickness or defect may be associated with a location about the object and the action may be associated with the location, as well.
[0013] Another aspects of the invention may be found in a control system. The control system may have an analyzer, a controller, and interfaces. An interface may receive data from a sonic energy detector. The analyzer may determine and/or generate a signal relating to the . . . The controller may use the signal from the analyzer to determine an appropriate control action. The action may be implemented using an interface to the process. Furthermore, the control system may have one or more modelers, one or more stored results, one or more threshold values, and one or more algorithms. Each of these may or may not be used by the analyzer or controller in performing their respective function.
[0014] As such, a system for control of a painting process is described. Other aspects, advantages and novel features of the present invention will become apparent from the detailed description of the invention when considered in conjunction with the accompanying drawings.
Brief Description of the Drawings
[0015] For a more complete understanding of the present invention and advantages thereof, reference is now made to the following description taken in conjunction with the accompanying drawings in which like reference numbers indicate like features and wherein:
[0016] FIG. 1 is a schematic block diagram the system, according to the invention;
[0017] FIG. 2 is a schematic block diagram of the system, according to the invention;
[0018] FIG. 3 is a block schematic diagram of an exemplary embodiment of a control system as seen in FIG. 2 ;
[0019] FIG. 4 is a block schematic diagram of an exemplary embodiment of an analyzer as seen in FIG. 3 ;
[0020] FIG. 5 is a schematic block diagram of an exemplary embodiment of the generator as seen in FIG. 1 ;
[0021] FIG. 6 is a schematic block diagram of an exemplary embodiment of a measuring device as seen in FIG. 1 ;
[0022] FIG. 7 is a block flow diagram of an exemplary method for use by the system of FIG. 2.; and
[0023] FIG. 8 is a schematic block diagram of an exemplary embodiment of the system as seen in FIGS. 1 and 2 .
[0024] Corresponding reference numerals indicate corresponding parts throughout the several views of the drawings.
Detailed Description of the Preferred Embodiment
[0025] Sonic energy traverses through objects with varying characteristics. These characteristics may include speed, wave type, frequency spectrum, amplitude. Further the sonic energy may partially reflect from surfaces or inconsistencies. Waves may also translate across a surface.
[0026] The characteristics of the sonic energy may be a function of various aspects of the substance about which the sonic energy travels. These aspects may include elasticity, internal structure, flaws, thickness of material, and layers of film, among others. These aspects may be a further function of temperature, state of dryness, and/or state of annealing. As such, sonic energy waves may be used to aid in determining aspects of the material for use in process control.
[0027] For example, sonic energy waves may generate information associated with paint thickness and the existence of defects within a paint film. Further the sonic energy waves may generate characteristics associated with multiple layer of paint. In addition, the thickness and/or defects may be associated with a location on the part. In this manner, problems may be corrected or the process may be adapted to improve future production.
[0028] FIG. 1 depicts a system, according to the invention. In the system 10, a sonic energy generator 12 may generate sonic energy waves in a test object 14. The system may also have a detector or measuring device 16. The detector or measuring device 16 may detect or measure the sonic energy waves. An interpreter 18 may be used to determine the sonic wave characteristic, material aspect and/or value of a variable from which the material aspect depends.
[0029] The sonic energy generator 12 may take various forms. These forms may include a coherent electromagnetic energy source, a laser, a plasma generator, and a transducer, among others. Further, the coherent electromagnetic energy source and/or laser may take various forms. These forms may include a CO2 laser, a q-switch YAG laser, a mid-IR laser, and other solid-state and/or gas lasers, among others. However, various lasers may be envisaged.
[0030] The measuring device 16 may take various forms. These forms may include an interferometer, a gas-coupled laser acoustic detector, and a transducer, among others. Further, the interferometer may take the form of a Mach-Zender, Fabry-Perot, Dual Differential Confocal Fabry-Perot, Two Wave Mixing, photorefractive or other interferometer. Other interferometers and sonic energy detection methods may be used as well. A laser may be used to generate coherent electromagnetic energy for use in the interferometer. One exemplary embodiment is a long pulse ND:YAG laser. However, other lasers may be used.
[0031] The interpreter 18 may take various forms. These forms may include a computer, workstation, handheld, computational circuitry, analog device, or digital alarm, among others. Further, the interpreter may compare the signal to an expected signal, determine the location of one or more peaks, determine the amplitude of one or more peaks, and transform the signal, among others. The interpreter may operate on the signal in a time domain or frequency domain, among others. Further, the interpreter may include a part model or representation of the part. In this manner, findings by the interpreter may be associated with locations about the part.
[0032] In one exemplary embodiment, the system may take the form of a laser ultrasound system. The laser ultrasound system may use a CO2 laser. A beam from the laser may be direct to the object. This beam may be directed through fiber optic cable. A ND:YAG laser may direct a beam of coherent electromagnetic energy toward the object. The beam may, at least in part, reflect from the object with an altered characteristic indicative of the sonic energy. Part of the reflected beam may be collected by the collection optics of a dual differential confocal Fabry-Perot interferometer. However, a photorefractive, two wave mixing, or other interferometer may be used.
[0033] In this exemplary embodiment, the interferometer may generate a signal. The signal may be interpreted by the interpreter or analyzer. From the signal, the interpreter or analyzer may determine a paint thickness or the presence of a defect associated with the paint. In addition, the thickness and/or defect may be associated with a location about the part.
[0034] FIG. 2 is a schematic block diagram of a system, according to the invention. The system 30 may have a generator 32, one or more measuring devices 36 and 38, and a control system 40. The control system 40 may or may not be coupled to generator 32 and the one or more measuring devices 36 and 38. The system 30 may or may not also be coupled to the process 42 and other variables 44. However, various configurations may be envisaged. These elements may be together, separate, or in various combinations, among others.
[0035] The generator 32 may generate sonic energy waves in the object 34. The one or more detectors 36 and 38 may detect the sonic energy waves. The control system 40 may receive signals from the one or more detectors 36 and 38. From the signals, the control system 40 may determine an appropriate control action. Further, the control system 40 may implement the control action. The control action may include manipulating characteristics associated with the generator, altering characteristics associated with the measuring device, and manipulating process parameters, among others. The control system may also use other process measurements, parameters, and variables 44 in determining the control action.
[0036] The generator 32 may take various forms. These forms may include a coherent electromagnetic energy source, a laser, a plasma generator, and a transducer, among others. Further, the coherent electromagnetic energy source and/or laser may take various forms. These forms may include a CO2 laser, a q-switch YAG laser, a mid-IR laser, and other solid-state and/or gas lasers, among others. However, various lasers may be envisaged.
[0037] The one or more measuring devices 36 and 38 may take various forms. These forms may include an interferometer, a gas-coupled laser acoustic detector, and a transducer, among others. Further, the interferometer may take the form of a Fabry-Perot, Dual Differential Confocal Fabry-Perot, Two Wave Mixing, photorefractive or other interferometer. Other interferometers and sonic energy detection methods may be used as well. A laser may be used to generate coherent electromagnetic energy for use in the interferometer. One exemplary embodiment is a long pulse ND:YAG laser. However, other lasers may be used.
[0038] The control system 40 may take various forms. These forms may include digital control, analog control, or distributed control system, among others. Further, the control system 40 may or may not be implemented on a computational circuitry, computer, or workstation, among others.
[0039] The variables 44 may take various forms. These forms may include known process parameters, other measured values, control parameters, model parameters, algorithm parameters, and set points, among others.
[0040] For example, a laser generator may direct a beam at a painted surface. The beam may impinge the surface or impart energy to sub-surfaces, generating a sonic energy signal such as an ultrasonic signal. The sonic energy signal may traverse layers and partially reflect from layer interfaces, gathering characteristics associated with the thickness of the layers, defects, and layer properties, among others. A measuring beam may be directed at the surface. The measuring beam may be reflected as a scattered beam having characteristics associated with the sonic energy signal. The scattered beam may be collected in an interferometer. The interferometer may derive a signal associated with the sonic energy signal.
[0041] A control system may use the signal from the interferometer to determine a control action. For example, the control system may determine a thickness of the paint and associated the thickness with a location about the part. The control system may then determine a control action. The control action may relate to the directing of the generation beam and/or measuring beam. In addition, the control action may relate to the behavior of a painting robot, a temperature, or a process variable, among others. Further, the control system may implement the control action.
[0042] FIG. 3 is a block diagram of an exemplary embodiment of a control system for use in the system as seen in FIG. 2 . The control system 50 may have analyzers 52, controllers 54, modelers 56, stored results 58, threshold values 60, algorithms 62, and interfaces 64. However, the control system may have some, all, or none of these elements. Further, these elements may be separate, together, or in various combinations, among others.
[0043] The analyzer 52 may perform various functions. These functions may include estimating parameters, determining location and/or amplitude of peaks, comparing location and/or amplitude of peaks to a value, and/or comparing the signals to expected signals. Further the analyzer 52 may perform these functions in time domain and/or frequency domain. In addition, the analyzer may utilize the output of the process, other variables, the modeler 56, stored results 58, and threshold values 60, among others.
[0044] The controller 54 may perform various functions. These functions may include determining an action in response to an output from the analyzer 52. The action may relate to manipulating process parameters, generator parameters, measuring device parameters, and other variables, among others. Further, the action may be an alert, alert, or message, among others. In addition, the controller 54 may utilize values of process and other variables in determining a control action.
[0045] The modeler 56 may take various forms. These forms may include a CAD model, a propagation model, and a control model, among others. Further, the model may use parameters and other outputs from the process, other variables, stored results, threshold values, process setting, and set points, among others, in performing its function. In addition, the model may interact with the controller 54 and/or the analyzer 52, to aid in the function of those units.
[0046] The stored results 58 may take various forms. These forms may include previous results, process data, expected results, modeler 56 output, analyzer 52 output, controller 54 output, and user data, among others. The stored results may or may not be accessed by the process, controller 54, analyzer 52, and modeler 60, among others.
[0047] The threshold values 60 may be used in various manners. These manners may include for comparison with peaks, set points, model output, process parameters, and other variables, among others. Further, these threshold values 60 may be determined automatically or set by a user.
[0048] The algorithms 62 may direct the performance of various functions. These functions may include controller, generator, measuring device, and process functionality, among others.
[0049] The interfaces 64 may take served to communicate with various devices. These devices may include the process, generator, measuring devices, other equipment, network interfaces and user interfaces, among others.
[0050] For example, the control system may receive a signal associated with the sonic energy signal about a part. The analyzer may determine a parameter associated with the thickness and/or defects in the paint film. For example, the analyzer may compare the signal with an expected result or threshold value. The expect result may be an output of a model such as a propagation model. Further, the analyzer may associate the data with a location about the part. For example, the analyzer may use a computer aided drafting (CAD) representation of the object to specify where the thickness and/or defect occur relative to the part. A controller may then determine an action from the output of the analyzer. For example, the controller may change the time a robotic painter spends in relation to the location for future parts. Alternately, the controller may alert a user about the location of the defect. In another example, the controller interface with a re-touch system for correcting the defect. However, various configurations may be envisaged.
[0051] Further, the control system may implement a statistical process control algorithm. With this algorithm, detected defects may be classified as random or as a pattern requiring adjustment. The control system may also determine which control actions most affect the defect. However, various control algorithms may be utilized.
[0052] FIG. 4 is a block diagram of an exemplary embodiment of an analyzer for use in the controller of FIG. 3 . Further, the analyzer may act as an interpreter as seen in FIG. 1 . The analyzer 70 may or may not have threshold values 72, transform instructions 74, expected results 76, outputs 78, comparison algorithms 80, and estimators 82. However, the analyzer 70 may have all, some, or none of the elements. Further, these elements may be separate, together, or in various combinations, among others.
[0053] The analyzer may receive data from other components in the control system, the measuring devices, process, or other variables, among others. The analyzer may function to analyze these signals together, separately, or in various combinations.
[0054] The transform instructions 74 may direct the implementation of various functions. These forms may include scaling and Fourier transforms, among others.
[0055] The expected results 76 may take various forms. These forms may include an expected time domain sonic wave, a frequency domain sonic wave response, a location of one or more peaks in a time domain and/or frequency domain data, an amplitude of one or more peaks in a time domain and/or frequency domain data, the output of a wave propagation model, a past result, and expected parameters of a model, among others. However, other expected results may be envisaged.
[0056] The comparison algorithms may implement various functions. These functions may include comparison between the signal and an expected result or threshold values. The comparison may be performed in a frequency and/or time domain, among others. Further, these functions may include comparing peak amplitudes with an expected amplitude or threshold value, subtracting an expected result from a signal, compare an parameter determined by the estimator 82 to a threshold or expected value, among others.
[0057] The estimator 82 may function to determine parameters associated with the data from the one or more measuring devices. For example, the estimate may fit a line or some other curve to the data. The estimator 82 may, alternately, regress parameters of a model from the data. Further, the estimator 82 may use various methods and algorithms for fitting and/or regressing. Further, the estimator 82 may use signals and inputs from the control system, process, measuring devices, generator, and other variables, among others, in regressing the parameters.
[0058] The outputs 78 may be outputs to other components of the control system. For example, the outputs may direct the results of the comparison algorithms 80, estimators 82, or transform instructions 74, among others, to other components of the control system such as the modeler, controller, interfaces, stored results, or other analyzers, among others.
[0059] For example, the analyzer may use the comparison algorithms to compare a signal from an interferometer with an expected signal. In one exemplary embodiment, the analyzer may compare the time-domain location of a peak to an expected peak to determine thickness. The expected peak may a past result, an output of a model, or a preferred value or set point, among others. Further, the expected result may be associated with the location of the measurement and vary from location to location.
[0060] FIG. 5 is an schematic block diagram of an exemplary embodiment of a laser as seen in FIG. 1 and FIG. 2 . The laser 90 may be used as a sonic energy generator or a beam generator for an interferometer, among others. The laser 90 may, for example, have a pulse generator 92 that generates a pulse. The pulse may traverse an isolator 94, a modulator 96, and one or more amplifiers 98. However, these elements may or may not be included. Further, these elements may be separate, together, or in any combination, among others.
[0061] The pulse generator 92 may take various forms. These forms may include those described above, among others. The isolator 94 may function to prevent backscattering of light into the pulse generator.
[0062] The modulator 96 may take various forms. These forms may include electro-optic modulators, and acousto-optic modulators, among others. Further, the modulator 96 may function to alter wave characteristics such as pulse length, pulse frequency profile, phase and pulse amplitude, among others. This function may or may not be implemented in conjunction with the amplifiers 98.
[0063] The amplifiers 98 may take various forms. These forms may include pumped slabs, cylinders, and zigzag slabs, among other. The amplifiers may function to increase the amplitude of the laser pulse. In addition, the amplifiers may be configured to alter other wave characteristics such as frequency profile, and pulse length, among others.
[0064] FIG. 6 is a schematic block diagram of a exemplary embodiment of a measuring device or detector as seen in FIGS. 1 and 2 . The measuring device 110 may have a generator 112, a modulator 114, a collector 118, a modulator 120, and an interferometer. These elements may or may not be included. Further, these elements may be together, separate, or in various combinations, among others.
[0065] The generator 112 may generate a coherent electromagnetic energy beam. The beam may or may not be modulated with modulator 114. The beam may be directed to an object 116. A modulated beam may reflect from the object 116 with a characteristic associated with sonic energy waves about the object 116. Part of the modulated beam may be collected in a collector 118. The collected beam may or may not be directed to a modulator 120. The beam may be directed to an interferometer 122 wherein the beam may be detected and measured.
[0066] The generator 112 may take various forms. These forms may include a coherent electromagnetic energy source or a laser, among others. Further, the coherent electromagnetic energy source and/or laser may take various forms. These forms may include a CO2 laser, a q-switch YAG laser, a mid-IR laser, an ND:YAG laser and other solid-state and/or gas lasers, among others. However, various lasers may be envisaged.
[0067] The modulator 114 may take various forms. These forms may include electro-optic modulators, and acousto-optic modulators, among others. Further, the modulator 114 may alter a characteristic of the beam such as frequency profile, pulse length, phase and pulse amplitude. This function may be performed in conjunction with an amplifier. For example, the modulator 114 may alter the wave characteristic to enhance reflection, compensate for beam attenuation, and compensate for Doppler effects relating to object movement or a scanning motion, among others.
[0068] The collector 118 may function to collect part of the reflected modulated beam. The collector may have various apertures.
[0069] The modulator 120 may take various forms. These forms may include electro-optic modulators, and acousto-optic modulators, among others. Further, the modulator 114 may alter a characteristic of the beam such as frequency profile, pulse length, phase and pulse amplitude. For example, the modulator 114 may alter the wave characteristic to enhance detection, compensate for beam attenuation, and compensate for Doppler effects relating to object movement or a scanning motion, among others.
[0070] The interferometer 122 may take various forms. These forms may include those listed above, among others. These forms may include a Fabry-Perot, dual differential confocal Fabry-Perot, two wave mixing, and photo-refractive interferometer, among others. The interferometer may send a signal relating to the sonic energy wave to an analyzer, control system, or interpreter, among others.
[0071] For example, an ND:YAG laser may generate a beam which is directed at a surface. Further the beam may be scanned across a surface causing an apparent Doppler effect. A representation may be used to determine a phase or frequency compensation to be applied by a modulator before or after the beam impinges the surface. Alternately, the modulator may adjust for signal attenuation. The beam may reflect from the surface and be collected by a collector. The signal may then be sent to an interferometer such as a dual differential confocal Fabry-Perot or a Two Wave Mixing Interferometer.
[0072] FIG. 7 is a block flow diagram of an exemplary method for use by the system as seen in FIG. 2 . In the method 130, a sonic energy wave may be generated about a test object as seen in a block 132. The sonic energy wave may, for example, be generated by directing a beam of coherent electromagnetic energy at the object. However, various means of generating sonic energy waves may be envisaged.
[0073] As seen in a block 134, the sonic energy wave may be detected and/or measured by a measuring device. For example, the sonic energy wave may be measured with an interferometer. However, various methods for measuring sonic energy waves may be envisaged.
[0074] An interpreter or analyzer may interpret a signal from the measuring device as seen in a block 136. The interpreter or analyzer may use various methods to determine a result. These methods may include regression of parameters from data, determination of the location or amplitude of a peak, and/or comparison of the location or amplitude of the peak to a threshold value, among others. The analysis may be performed on time domain or frequency domain data. In addition, the analysis may utilize generator parameters, object parameters, measurement device parameters, process measurements, and/or process variables, among others.
[0075] From the interpretation, a controller or control system may determine an action as seen in a block 138. This action may be to alter a parameter associated with the process. Alternately, the action may relate to the sonic generator, the measurement device, or other process variables. The control system may implement the action as seen in a block 140. For example, the action may be to adjust a parameter associated with a painting time for a specific location, adjust a temperature, or alter a paint composition, among others. In another example, the action may be to alter the frequency of a laser beam to compensate for beam attenuation, Doppler distortion, or noise, among others. In a further example, the action may to alter a characteristic of measuring device. Further, the action may be an alarm or alert. However, various actions may be envisaged.
[0076] FIG. 8 is a schematic block diagram of an exemplary embodiment of the system as seen in FIGS. 1 and 2 . The system 150 may have a painted object 152 with one or more paint layers. These paint layers may have varying thickness and or defects 154. A generator laser 156 may generate a beam. A mirror 158 may direct the beam to a location on the surface of the object 152. The mirror 158 may rotate to scan or redirect the beam. The scanning or redirecting may also in accordance with a representation of the object 152. The generator beam may cause a sonic energy signal in the object. The sonic energy signal may partially reflect from the paint layer interfaces and/or defect 154.
[0077] A measuring beam generator 160 may generate a measuring beam. A mirror 162 may direct the measuring beam to a location on the surface of the object 152. The location may be the same or different from that of the generator beam. The location may be controlled in accordance with a representation of the object 152. The measuring beam may reflect from the surface with characteristic associated with the sonic energy signal. The reflected beam may be collected by an interferometer apparatus 164. The interferometer apparatus 164 may generate a signal associated with the sonic energy signal.
[0078] A control system 166 may determine the thickness and or location of the defect. For example, an analyzer may compare the signal to an expected result. The expected result may be a result of a propagation model, a previous known result, and a location or amplitude of a peak, among others. Alternately, the analyzer may regress a parameter associated with paint thickness from the data in accordance with a model. Further, the analyzer may associate the result with a location about the object. In addition, the expected result may be associated with the location. For example, the analyzer may associate a thickness parameter with a location on a CAD model of the object and compare the thickness parameter to an expected value also associated with the location.
[0079] From the analyzer output, a controller may determine a control action. This control action may adjust parameters associated with the painting equipment and paint. For example, the controller may determine that a robotic painter should spend more or less time over a given location. Alternately, the control action may be to control a re-touch painting robot or alert a user of a defect and its location. Further, the controller may determine a testing location for the generator beam and the measuring beam. However, various configurations and control actions may be envisages.
[0080] As such, a system and method for process control of a painting process is described. In view of the above detailed description of the present invention and associated drawings, other modifications and variations will now become apparent to those skilled in the art. It should also be apparent that such other modifications and variations may be effected without departing from the spirit and scope of the present invention as set forth in the claims which follow.
Claims
What is claimed is:
1. An apparatus for determining and implementing a control action associated with a characteristic of one or more paint layers, the one or more paint layers associated with a part in a manufacturing process, the apparatus comprising:
a first coherent electromagnetic energy source, the first coherent electromagnetic energy source producing a generator beam of coherent electromagnetic energy, the generator beam of coherent electromagnetic energy impinging the one or more paint layers and generating a sonic energy signal, wherein the sonic energy signal comprises a plurality of sonic energy waves about the one or more paint layers;
a second coherent electromagnetic energy source, the second coherent electromagnetic energy source producing a measuring beam of coherent electromagnetic energy, the measuring beam of coherent electromagnetic energy impinging the one or more paint layers, the measuring beam of coherent electromagnetic energy reflecting from the one or more paint layers as a scattered electromagnetic energy, the scattered electromagnetic energy having a modulation associated with the sonic energy waves of the sonic energy signal, wherein the measuring beam of coherent electromagnetic energy is coaxially applied to the one or more paint layers with the generator beam of coherent electromagnetic energy;
an optical amplifier operable to amplify the scattered electromagnetic energy;
an interferometer, the interferometer collecting part of the scattered electromagnetic energy and deriving a signal indicative of the sonic energy waves of the sonic energy signal from the scattered electromagnetic energy;
an interpreter, the interpreter determining the characteristic associated with the one or more paint layers from the signal indicative of the sonic energy waves of the sonic energy signal; and
a controller, the controller determining a control action associated with the characteristic associated with the one or more paint layers.
2. The apparatus of claim 1 wherein the first coherent electromagnetic energy source is a CO2 laser.
3. The apparatus of claim 1 wherein the second coherent electromagnetic energy source is a ND:YAG laser.
4. The apparatus of claim 1 wherein the characteristic associated with the one or more paint layers is associated with thickness.
5. The apparatus of claim 1 wherein the characteristic associated with the one or more paint layers is associated with a defect.
6. The apparatus of claim 1 wherein the characteristic is associated with a location about the part.
7. The apparatus of claim 1 wherein the controller initiates the producing of the generator beam of coherent electromagnetic energy.
8. The apparatus of claim 1 wherein the controller initiates the producing of the measuring beam.
9. The apparatus of claim 1 wherein the controller alters a parameter associated with the manufacturing process.
10. An apparatus for determining and implementing a control action associated with a characteristic of one or more paint layers, the one or more paint layers associated with a part in a manufacturing process, the apparatus comprising:
a first coherent electromagnetic energy source, the first coherent electromagnetic energy source producing a generator beam of coherent electromagnetic energy, the generator beam of coherent electromagnetic energy impinging the one or more paint layers and generating a sonic energy signal, wherein the sonic energy signal comprises a plurality of sonic energy waves about the one or more paint layers;
a second coherent electromagnetic energy source, the second coherent electromagnetic energy source producing a measuring beam of coherent electromagnetic energy, the measuring beam of coherent electromagnetic energy impinging the one or more paint layers, the measuring beam of coherent electromagnetic energy reflecting from the one or more paint layers as a scattered electromagnetic energy, the scattered electromagnetic energy having a modulation associated with the sonic energy waves of the sonic energy signal, wherein the measuring beam of coherent electromagnetic energy is coaxially applied to the one or more paint layers with the generator beam of coherent electromagnetic energy;
an optical amplifier operable to amplify the scattered electromagnetic energy;
an optical isolator to prevent feedback into the optical amplifier,
an interferometer, the interferometer collecting part of the scattered electromagnetic energy and deriving a signal indicative of the sonic energy waves of the sonic energy signal from the scattered electromagnetic energy;
an interpreter, the interpreter determining the characteristic associated with the one or more paint layers from the signal indicative of the sonic energy waves of the sonic energy signal; and
a controller, the controller determining a control action associated with the characteristic associated with the one or more paint layers.
11. The apparatus of claim 10 wherein the first coherent electromagnetic energy source is a CO2 laser.
12. The apparatus of claim 10 wherein the second coherent electromagnetic energy source is a ND:YAG laser.
13. The apparatus of claim 10 wherein the characteristic associated with the one or more paint layers is associated with thickness.
14. The apparatus of claim 10 wherein the characteristic associated with the one or more paint layers is associated with a defect.
15. The apparatus of claim 10 wherein the characteristic is associated with a location about the part.
16. A method for determining and implementing a control action associated with a characteristic of one or more paint layers, the one or more paint layers associated with a part in a manufacturing process the method comprising:
producing a generator beam of coherent electromagnetic energy with a first coherent electromagnetic energy source, the generator beam of coherent electromagnetic energy impinging the one or more paint layers and generating a sonic energy signal, wherein the sonic energy signal comprises a plurality of sonic energy waves about the one or more paint layers;
producing a measuring beam of coherent electromagnetic energy with a second coherent electromagnetic energy source, the measuring beam of coherent electromagnetic energy impinging the one or more paint layers, the measuring beam of coherent electromagnetic energy reflecting from the one or more paint layers as a scattered electromagnetic energy, the scattered electromagnetic energy having a modulation associated with the sonic energy waves of the sonic energy signal, wherein the measuring beam of coherent electromagnetic energy is coaxially applied to the one or more paint layers with the generator beam of coherent electromagnetic energy;
collecting part of the scattered electromagnetic energy with an interferometer;
optically amplifying the scattered electromagnetic energy prior to the interferometer;
deriving a signal indicative of the sonic energy waves of the sonic energy signal from the scattered electromagnetic energy;
determining with an interpreter the characteristic associated with the one or more paint layers from the signal indicative of the sonic energy signal; and
determining with a controller a control action associated with the characteristic associated with the one or more paint layers.
17. The method of claim 16 wherein the first coherent electromagnetic energy source is a CO2 laser.
18. The method of claim 16 wherein the second coherent electromagnetic energy source is an ND:YAG laser.
19. The method of claim 16 wherein the characteristic associated with the one or more paint layers is associated with thickness.
20. The method of claim 16 wherein the characteristic associated with the one or more paint layers is associated with a defect.
21. The method of claim 16 wherein the characteristic is associated with a location about the part.
22. The method of claim 16 the method further comprising: initiating the generator beam of coherent electromagnetic energy with the controller.
23. The method of claim 16 the method further comprising: initiating the measuring beam of coherent electromagnetic energy with the controller.
24. The method of claim 16 the method further comprising: altering a parameter associated with the manufacturing process.
25. The method of claim 16, further comprising preventing reflected phase modulated light feedback into the optical amplifier with at least one optical isolation assembly placed in the path of propagation of the scattered electromagnetic energy.
Patent Citations (48)
| Patent | Date | Inventor | Cited By |
|---|---|---|---|
| US3911733(A) | 1975-10-01 | Bhuta et al. | Applicant |
| US3992627(A) | 1976-11-01 | Stewart | Applicant |
| US4349112(A) | 1982-09-01 | Wilks et al. | Applicant |
| US4355538(A) | 1982-10-01 | Hall | Applicant |
| US4388830(A) | 1983-06-01 | Narushima et al. | Applicant |
| US4393711(A) | 1983-07-01 | Lapides | Applicant |
| US4422177(A) | 1983-12-01 | Mastronardi et al. | Applicant |
| US4659224(A) | 1987-04-01 | Monchalin | Applicant |
| US4803639(A) | 1989-02-01 | Steele et al. | Applicant |
| US4809308(A) | 1989-02-01 | Adams et al. | Applicant |
| US4841460(A) | 1989-06-01 | Dewar et al. | Applicant |
| US5014293(A) | 1991-05-01 | Boyd et al. | Applicant |
| US5065630(A) | 1991-11-01 | Hadcock et al. | Applicant |
| US5113079(A) | 1992-05-01 | Matulka | Applicant |
| US5119408(A) | 1992-06-01 | Little et al. | Applicant |
| US5122672(A) | 1992-06-01 | Mansour | Applicant |
| US5140533(A) | 1992-08-01 | Celette | Applicant |
| US5295073(A) | 1994-03-01 | Celette | Applicant |
| US5319567(A) | 1994-06-01 | Ebenstein | Applicant |
| US5384717(A) | 1995-01-01 | Ebenstein | Applicant |
| US5442572(A) | 1995-08-01 | Kiridena et al. | Applicant |
| US5490195(A) | 1996-02-01 | Berkley | Applicant |
| US5541856(A) | 1996-07-01 | Hammermeister | Applicant |
| US5552984(A) | 1996-09-01 | Crandall et al. | Applicant |
| US5574226(A) | 1996-11-01 | Reuther et al. | Applicant |
| US5623307(A) | 1997-04-01 | Kotidis et al. | Applicant |
| US5637812(A) | 1997-06-01 | Baker et al. | Applicant |
| US5672830(A) | 1997-09-01 | Rogers et al. | Applicant |
| US5724138(A) | 1998-03-01 | Reich et al. | Examiner |
| US5848115(A) | 1998-12-01 | Little et al. | Applicant |
| US5982482(A) | 1999-11-01 | Nelson et al. | Applicant |
| US6016202(A) | 2000-01-01 | Fuchs et al. | Examiner |
| US6023985(A) | 2000-02-01 | Fournier | Applicant |
| US6047041(A) | 2000-04-01 | Ellinger | Applicant |
| US6065348(A) | 2000-05-01 | Burnett | Applicant |
| US6078397(A) | 2000-06-01 | Monchalin et al. | Applicant |
| US6092419(A) | 2000-07-01 | Dixon et al. | Applicant |
| US6108087(A) | 2000-08-01 | Nikoonahad et al. | Applicant |
| US6122060(A) | 2000-09-01 | Drake, Jr. | Examiner |
| US6128081(A) | 2000-10-01 | White et al. | Examiner |
| US6205240(B1) | 2001-03-01 | Pietrzak et al. | Applicant |
| US6220099(B1) | 2001-04-01 | Marti et al. | Applicant |
| US6322666(B1) | 2001-11-01 | Luontama et al. | Applicant |
| US6360621(B1) | 2002-03-01 | Eldred et al. | Applicant |
| US6378387(B1) | 2002-04-01 | Froom | Applicant |
| US6466643(B1) | 2002-10-01 | Bueno et al. | Applicant |
| US6571008(B1) | 2003-05-01 | Bandyopadhyay et al. | Applicant |
| US6637266(B1) | 2003-10-01 | Froom | Applicant |
Non-Patent Literature (23)
- http://metwww.epfl.ch/Brillouin/physique—brillouinE.thm; “Physics of Brillouin scattering”; Mar. 26, 2002; 3 pages.Applicant
- Using Light to Measure Temperature and Strain; Report No. 6; date unknown; 4 pages.Applicant
- “Temperature and annealing dependence of the longitudinal ultrasonic velocity in aluminum alloys”; Johnson, Ward et al.; J. of Mater. Res., vol. 8, No. 7, p. 1558; 1996.Applicant
- http://nte-serveur.univ-lyon1.fr/nte/spectroscopie/resumESOPS/Alig1.htm; “Ultrasonic spectroscopy For characterization of Polymeric Materials”; I. Alig and D. Lellinger; Mar.26, 2002; 2 pages.Applicant
- “Temperature Dependence of Ultrasonic Velocity Using Diffuse Fields; Implications for Measurement of Stress”; Richard Weaver and Oleg Lobkis; Department of Theoretical and Applied Mechanics; University of Illinois; reprint QNDE 2000; 8 pages.Applicant
- NTIAC Newsletter; vol. 27, No. 5, Sep. 2002, 5 pp.Applicant
- Froom, Douglas A., et al.; Solving Problems with Advanced Technology, 1999 IEEE, 4 pp.Applicant
- Alkire, M.G., Department of the Air Force Memo regarding Construction Project Data; May 7, 1982, Bates 000010 through Bates 000068.Applicant
- U.S. Air Force, Military Construction Project Data, Apr. 14, 1982, Bates 000074 through Bates 000129.Applicant
- U.S. Air Force, Attachment I to Request for Environmental Impact Analysis, Dec. 2, 1982, Bates 000130 through Bates 000167.Applicant
- Stanghellini, Frank D., Department of the Air Force Memo regarding Criteria Changes, Jan. 9, 1985, Bates 000168 through Bates 000214.Applicant
- Metro Today, The Sacramento Union; May 12, 1983, Bates 000215 through Bates 000216.Applicant
- Letter Contract Between Department of the Air Force and Par Systems Corp., Aug. 3, 1984, Bates 000217 through Bates 000312.Applicant
- Timeline and Equipment List for Contract Between Department of the Air Force and Par Systems Corp., Aug. 3, 1984, Bates 000313 through Bates 000325.Applicant
- Spacemaker, Jun. 19, 1997, Bates 000326 through 000327.Applicant
- Civilian Personnel Position Description, Department of the Air Force; Jul. 10, 1989, Bates 000328 through Bates 000332.Applicant
- Aviation Week & Space Technology, Mar. 13, 1989, Bates 000333 through Bates 000336.Applicant
- UltraOptec, Laser Ultrasonic System, 1999 IEEE, Bates 000337 through Bates 000336.Applicant
- J.W. Bader, et al., Laser Ultrasonics or Alternative NDI Composite Defect, Nov. 20, 1990, Bates 000342 through Bates 000446.Applicant
- Douglas A. Froom, Statement of Work for Advanced Ultrasonic Component Inspection System, Jul. 14, 1993, Bates 000447 through 000490.Applicant
- Award of Contract from Department of the Air Force, Aug. 11, 1993, Bates 000491 through Bates 000492.Applicant
- UltraOptec, LUIS Phase 3 Acceptance Test Report, Feb. 16, 1996, Bates 000493 through Bates 000501.Applicant
- Spacemaker, Feb. 22, 1996, Bates 000502.Applicant