US 5,986,932 AGrant

Non-Volatile Static Random Access Memory and Methods for Using Same

Issue Date:1999-11-16

•19 Claims

•10 Drawing Sheets

Abstract

The state of a memory cell is stored by selectively imbalancing threshold voltages of storage elements of the memory cell. The threshold voltages may be selectively imbalanced by pulsing the supply voltage for the memory cell from an operating voltage level to a programming voltage level. This may be accomplished by raising the supply voltage from the operating voltage level to the programming voltage level for a period of time sufficient to store the state of the memory cell by monitoring the leakage current from the programming voltage level such that it just falls below a preestablished limit. Alternatively, the supply voltage may be repeatedly toggled between the operating voltage level and the programming voltage level for fixed time intervals until the state of the memory cell is stored. The number of toggling operations may be determined by monitoring the leakage current such that it just falls exceeds a predetermined limit. The programming voltage level may be approximately twice the operating voltage level or greater. Selectively imbalancing the threshold voltages of the storage elements may be accomplished by creating a first electric field within a first of the storage elements to tunnel electrons off of a floating gate of the first storage element and creating a second electric field within a second of the storage elements to inject the electrons onto a floating gate of the second storage element. Preferably, these electric fields are created simultaneously by applying the programming voltage to the memory cell.

Metadata

Assignee

Cypress Semiconductor Corp.

Inventors

K. Nirmal Ratnakumar
Frederick B. Jenne

Application Information

Application Number:US 8851565

Filing Date:1997-06-30

Priority Date:1997-06-30

Art Unit:288

Classifications

IPC:

G11C 700

Field of Search:

365185.07;185.19;185.24;185.28;185.08

Patent Drawings (10 sheets)

Description

Related Application

This application is related to a co-pending application Ser. No. 08/926611, filed Sep. 10, 1997, entitled "Non-Volatile Random Access Memory and Methods for Making and Configuring Same" by Fredrick B. Jenne and assigned to the Assignee of the present invention.

Field of the Invention

The present invention relates to memory devices and, in particular, those memory devices which integrate non-volatile storage capability in read/write memory architectures.

Background

Conventional read/write memories, for example static random access memories (SRAMs), as are commonly used in computer systems lose their stored information when power is removed from the device. Thus, a computer system which has only read/write memory will lose all of its stored information if power is removed or temporarily lost. Accordingly, computer system designers have recognized the need to back up information stored in volatile memories in the event that power is lost, e.g., during a blackout or brownout.

One way to back up a volatile memory such as an SRAM is to transfer the data stored in the SRAM to a separate non-volatile memory before the power is turned off or is about to fail. Unfortunately, such a solution requires that the data be transferred bit-by-bit between the volatile memory and the non-volatile memory. Such a data transfer, which typically occurs over a slow, serial link, cannot accommodate the large amounts of data stored in modern SRAMs (e.g., of the order of 14 Mbits) before a complete failure of power.

Recognizing that the serial transfer of data between volatile and non-volatile devices is not an acceptable solution, memory designers have attempted to incorporate non-volatile storage devices within conventional SRAM architectures. In this way, the memory circuits operate in the conventional manner during usual operation but, upon an appropriate command, the data state stored in the volatile memory cells of the device can be transferred to the non-volatile storage elements of the device. When power is restored, this data state can be returned to the volatile memory elements.

Although the combination of volatile and non-volatile memory elements within the same device has been attempted, the solutions of the past tend to produce memory cells having a substantially increased area configuration. For example, memory devices such as that shown in FIG. 1 have attempted to integrate non-volatile storage elements with conventional six transistor (6T) or four transistor (4T) SRAMs. FIG. 1 illustrates a non-volatile SRAM (NVSRAM) 10 that includes a volatile storage portion 12 and a nonvolatile storage portion 14. Volatile storage portion 12 is a conventional 2T-2R SRAM cell which includes resistors 16 and 18 and N-channel transistors 20 and 22. When coupled together as shown in FIG. 1, resistor-transistor pairs 16 and 20, and 18 and 22 act as latches to store a logic state of SRAM cell 10. Volatile storage portion 12 is coupled between a pair of bit lines, BL and BL, through a pair of select transistors 24 and 26. Select transistors 24 and 26 couple volatile storage portion 12 to the bit lines BL and BL in response to control signals from word line WL.

Coupled to volatile storage portion 12 is non-volatile storage portion 14. Non-volatile storage portion 14 includes SONOS cells 28-34 and select transistors 36 and 38. SONOS cells 28-34 are non-volatile storage elements which use a nitride floating gate. In response to a programming voltage (Vpas) applied to a control line 40, SONOS cells 30 and 34 capture the logic state of volatile storage portion 12. This state is retained by SONOS cells 28-34 even if power is removed from memory cell 10. To recall the state, for example upon power up, a recall voltage (Vrcl) is applied to control line 42. This has the effect of restoring the stored state of memory cell 10 to the volatile storage portion 12. Non-volatile storage portion 14 is coupled into and/or out of memory cell 10 in response to a select voltage (Vse) applied to control line 44.

NVSRAM cell 10 is very large (in terms of die area) as compared to a conventional SRAM cell (e.g., a conventional 6T cell). In particular, six additional elements, SONOS cells 28-34 and pass gates 36 and 38, as well as three additional control lines, 40-44, are added to a conventional SRAM cell. Further, SONOS cells 28-34 require specifically timed to properly store and recall the state of memory cell 10. Thus, in addition to requiring complex pulses on control lines 40-44 for non-volatile operation, such a cell requires increased die area and, for a given size die, will reduce the density of available storage cells. It would be desirable to have a non-volatile SRAM cell which does not require the significantly increased die area and/or control pulses of such cells of the past.

Summary of the Invention

In one embodiment the present invention provides a method of storing a state of a memory cell. Threshold voltages of storage elements of the memory cell are selectively imbalanced, for example by pulsing a supply voltage for the memory cell from an operating voltage level to a programming voltage level, to store the state of the cell. The pulsing operation may include raising the supply voltage from the operating voltage level to the programming voltage level for a period of time sufficient to store the state of the memory cell. Alternatively, the pulsing operation may include repeatedly toggling the supply voltage between the operating voltage level and the programming voltage level for predetermined time intervals until the state of the memory cell is stored. The programming voltage level may be approximately twice the operating voltage level or greater.

Selectively imbalancing the threshold voltages of the storage elements of the memory cell may include creating an electric field within one of the storage elements to tunnel electrons off a floating gate of that storage element. In addition, another electric field within another of the storage elements may be created to inject electrons onto a floating gate of the other storage element. Preferably, the electric fields are created simultaneously by applying a programming voltage to the memory cell.

In a further embodiment, the present invention provides a method which includes raising a supply voltage to a memory cell from an operating voltage level to a programming voltage level to store a state of the memory cell. This may be accomplished by repeatedly toggling the supply voltage between an operating voltage level and a programming voltage level until the state of the memory cell is stored. The method may further include removing the supply voltage from the memory cell and then energizing the memory cell to the operating voltage level to recover a further state of the memory cell. The further state being a logical inverse of the original state.

In yet a further embodiment the present invention provides a memory including a cell configured to dynamically alter threshold voltages of storage elements of the cell. This cell may be configured to dynamically alter the threshold voltages in response to a supply voltage being raised from an operating voltage level to a programming voltage level and the storage elements may comprise a pair of stacked gate transistors.

Brief Description of the Drawings

The present invention is illustrated by way of example and not limitation in the figures of the accompanying drawings in which:

FIG. 1 illustrates a non-volatile SRAM cell using SONOS cells;

FIG. 2 illustrates a computer system including a memory configured according to one embodiment the present invention;

FIG. 3 further illustrates a memory configured in accordance with the present invention;

FIG. 4 illustrates a non-volatile SRAM cell configured according to one embodiment of the present invention;

FIG. 5 illustrates a storage and recall cycle for a non-volatile SRAM cell according to an embodiment of the present invention;

FIG. 6 is a cross-sectional view of a transistor pair for a non-volatile SRAM according to an embodiment of the present invention;

FIG. 7 is an exploded view of a stacked gate transistor for use according to one embodiment of the present invention;

FIG. 8 is a cross-sectional view of another transistor pair of a non-volatile SRAM according to an embodiment of the present invention;

FIG. 9 is a flow diagram illustrating a storage operation in accordance with one embodiment of the present invention;

FIG. 10A is flow diagram illustrating a storage operation in accordance with yet another embodiment of the present invention;

FIG. 10B illustrates a storage and recall operation in accordance with yet a further embodiment of the present invention; and

FIG. 11 illustrates the increase in subthreshold leakage current of a p-channel transistor when its threshold voltage is shifted towards conduction.

Detailed Description

Described herein is a non-volatile random access memory (RAM) and methods of using same. In one embodiment the present method provides for storing a state of a memory cell in the non-volatile RAM. Threshold voltages of storage elements of the memory cell are selectively imbalanced, for example by pulsing a supply voltage for the memory cell from an operating voltage level to a programming voltage level, to store a state of the cell. The pulsing operation may include raising the supply voltage from the operating voltage level to the programming voltage level for a period of time sufficient to store the state of the memory cell. Alternatively, the pulsing operation may include repeatedly toggling the supply voltage between the operating voltage level and the programming voltage level a number of times until the state of the memory cell is stored. The programming voltage level may be approximately twice the operating voltage level.

In a further embodiment, the present invention provides a method which includes raising a supply voltage to a memory cell from an operating voltage level to a programming voltage level to store a state of the memory cell. This may be accomplished by repeatedly toggling the supply voltage between the operating voltage level and the programming voltage level until the state of the memory cell is stored. The method may further include removing the supply voltage from the memory cell and then energizing the memory cell to the operating voltage level to recover a further state of the memory cell. The further state being a logical inverse of the original state.

FIG. 2 illustrates a computer system 50 which includes a memory 52 configured in accordance with an embodiment of the present invention. Memory 52 is coupled to a bus 54 which provides a communication path between memory 52 and a processor 56. In general, processor 56 uses memory 52 as a store of data and/or instructions. Computer system 58 may further include one or more functional units 58 which are coupled to bus 54. The functional units 58 may serve a variety of purposes, for example these units may be input/output (I/O) devices which transfer information (e.g., data and/or control signals) to/from processor 56 and/or memory 52. Further, functional unit(s) 58 may be (a) bus bridge(s) which provides a communication path between bus 54 and another bus (not shown), e.g., a system bus, within computer system 50. In such a configuration, bus 54 may serve as a local or processor bus.

Although the remaining discussion will generally assume that it is memory 52 which is configured as a non-volatile random access memory according to the present invention it should be recognized that processor 56 may include an onboard cache memory (not shown). Such a cache memory operates as a local storage system for processor 56 and is generally configured to provide rapid read and/or write capability. The present invention finds equal applicability for use in such a cache memory (or, further, for an external or L2 cache memory which may be coupled between processor 56 and bus 54). Accordingly, any references to the configuration and/or operation of memory 52 should be understood as being equally applicable to an onboard (or L1) cache within processor 56 and/or an external (or L2) cache. Note that in some processors, L1 and L2 caches may be contained on a single integrated circuit or the L2 cache may comprise a separate chip within a single package containing the L2 cache and a processor care. Further, the L1 cache may be implemented as separate instruction and data caches. All of these configurations are contemplated by the present invention, however, the present invention is not restricted to only L1 and L2 cache memories.

FIG. 3 illustrates memory 52 in more detail. Memory 52 generally includes a memory core 60 which is made up of a number of memory cells, one or more of which may be configured as non-volatile random access cells in accordance with the present invention. The cells of memory core 60 are accessed during read or write operations using bitlines 62 and wordlines 64. The bitlines 62 are selected using a column decoder 66 which receives and decodes address information from a plurality of address lines 68. Similarly, word lines 64 are selected by row decoder 70 in response to address information on address lines 72. Address lines 68 and 72 may be part of bus 54.

During a memory write operation, data presented on Data In bus 74 may be applied to selected bitlines 62 through write path circuitry 76. (In general, portions of the write path circuitry may be shared by portions of the read path circuitry and, thus, the two are shown as a single block 76.) Individual cells of a column (associated with the selected bitlines) within memory core 60 are selected by appropriate wordlines 64 and the data from the Data In bus 74 is stored in one or more of the memory cells. During a memory read, data is read out of selected memory cells through read path circuitry 76 to a Data Out bus 78. Data In bus 74 and Data Out bus 78 may be the same bus (at least in part) and is/are coupled to bus 54. Read and write operations are controlled using one or more control signals 80 (from bus 54) which are decoded and/or buffered using control circuitry 82 to provide appropriate internal control signals 84 to the read/write path circuits 76.

FIG. 4 illustrates a memory cell 100 configured in accordance with the present invention. Memory cell 100 may be found within memory core 60 of memory 52 and/or may be a memory cell of a cache memory located onboard and/or external to processor 56. Alternatively, memory cell 100 may be part of a random access memory or serial memory employed in other applications, such as communication systems, computer peripherals, etc. Memory cell 100 resembles (at least in terms of gross structure) a conventional 6-transistor (6T) SRAM cell but provides at least the following advantages over NVSRAMs of the past. First, memory cell 100 is, in contrast with the large NVSRAM cell 10 shown in FIG. 1, approximately equal in size to a conventional 6T SRAM cell since the number of transistor elements is the same in both cases. Second, non-volatile (NV) storage and recall operations are launched by merely changing the supply voltage (Vcc-Vss) across terminals V.sub.1 and V.sub.2 to a programming voltage and do not require additional control lines for each cell 100. The NV storage and recall operations are performed by band-to-band tunneling induced hot electron (BBHE) injection and uniform Fowler-Nordheim (F-N) tunneling, both of which are very efficient compared to traditional channel hot electron (CHE) injection methods used in a majority of NVRAMs.

Memory cell 100 includes four conventional NMOS transistors: N.sub.1 and N.sub.2 for pull-down and S.sub.1 and S.sub.2 for selecting or transferring data between the cell 100 and the bit lines BL and BL. PMOS pull-up transistors P.sub.1 and P.sub.2 are stacked gate, double-poly transistors with a bottom tunnel dielectric, poly-silicon floating gate and a top poly-silicon control gate. The control gates and floating gates are isolated by a thin poly-to-poly coupling dielectric which may be an ONO stack or a deposited oxide, deposited at high temperature. The simplest tunnel dielectric is a thermally grown or a high temperature deposited oxide.

The operation of memory cell 100 is briefly described as follows. With a normal supply voltage (Vcc-Vss) across terminals V.sub.1 -V.sub.2, memory cell 100 functions exactly like a conventional SRAM cell with unlimited, fast read/write operations. An NV storage operation is shown in FIG. 5 and is enabled by boosting the supply voltage (Vcc-Vss) to higher or programming voltage (Vpp-Vnn).gtoreq.2 (Vcc-Vss), such that E.sub.OX, the field across the tunnel oxide, .gtoreq.8MV/cm for a specified time (T.sub.STOR) of the order of 1-10 msec. Note that Vnn may be equal to Vss. During this time (T.sub.STOR), electrons are injected by BBHE into the floating gate of the non-conducting stacked gate PMOS transistor while electrons tend to be removed by F-N tunneling from the floating gate of the conducting stacked gate PMOS transistor. These details are explained further below.

At the end of a storage operation, there is an imbalance in the threshold voltages (V.sub.T s) of the stacked gate PMOS transistors P.sub.1 and P.sub.2. The V.sub.T of the "OFF" (i.e., non-conducting) conducting) PMOS transistor becomes more positive due to BBHE injection while the V.sub.T of the "ON" (i.e., conducting) PMOS transistor tends to become negative due to F-N tunneling current. After the storage operation, Vcc can be removed indefinitely. During this power down time, the difference in the PMOS V.sub.T s will be preserved.

Two features of this storage operation are:

1. The imbalance created in the V.sub.T s of the PMOS transistors are opposite to their current conducting states, i.e., the V.sub.T of the non-conducting PMOS transistor is shifted towards the conducting state and vice-versa.

2. This kind of imbalance may be created for all the NV cells 100 in the entire memory core 60 during the storage operation.

As further shown in FIG. 5, an NV recall operation may be performed in two stages. On power up (Phase 1), the PMOS transistor with a less negative V.sub.T becomes conducting or "ON". This was the "OFF" PMOS transistor during the NV storage operation. Thus, on initial power up, the recalled state of cell 100 is the inverse of the cell state during the NV storage operation. To retrieve the original state of cell 100, one more NV storage operation (a "dummy" storage operation) is performed by raising Vcc to Vpp (and lowering Vss to Vnn if desired). This is followed by a power down period (Vcc is removed) and a second power up (Phase 2) during which the supply voltage to the cell 100 raised from 0 to Vcc. Due to the inversion of states during the dummy storage and recall (Phase 2 power up) operations, the state recalled after the Phase 2 power up is the same as the original state when the first storage operation was performed. Thus, the originally stored state of cell 100 is recovered.

Table 1 describes these modes of operation and assumes that cell 100 is initialized so that VD1=Vss (i.e., BL=Vs) and VD2=Vcc (i.e., BL=Vcc). Select transistor S1 and S2 are off after the initial write during the NV storage operation when Vcc is raised to Vpp. Also the voltage at V2 can be pulled down to Vnn<Vss if the NMOS transistors N1 and N2 are in a p-well in an n-well (triple well) scheme.

To summarize then, during NV storage and/or recall operations, the threshold voltages of transistors P1 and P.sub.2 of memory cell 100 are selectively imbalanced by pulsing a supply voltage for cell 100 from an operating voltage level (e.g., Vcc) to a programming voltage level (e.g., Vpp). As further discussed below, the pulsing operation may include raising the supply voltage from the operating voltage level to the programming voltage level for a predetermined period of time (e.g., T.sub.STOR) sufficient to store the state of memory cell 100. Alternatively, the pulsing operation may include repeatedly toggling the supply voltage between the operating voltage level and the programming voltage level for predetermined time intervals until the state of the memory cell is stored. The programming voltage level may be approximately twice the operating voltage level.

FIG. 6 is a cross-section along line A--A of FIG. 4 and further illustrates transistors N.sub.1 and P.sub.1. As shown, transistor N.sub.1 may be formed in a p-well 200 in a p-type substrate 202. Transistor N.sub.1 includes a gate structure 206 disposed over an active region 208 having a source 210 and a drain 212. Stacked gate transistor P.sub.1 may be formed in an n-well 214 disposed within p-substrate 202 and includes gate structure 216 disposed over active region 218. Active region 218 includes drain 220 and source 222. The gate structure 216 is made up of control gate 224 disposed over floating gate 226. As indicated above, floating gate 226 and control gate 224 may be poly-silicon structures. The control gate 224 and floating gate 226 are isolated by a thin poly-to-poly coupling dielectric 228 which may be an ONO stack or a deposited oxide, deposited and/or annealed at high temperature (e.g., >700.degree. C). Below floating gate 226 is a tunnel dielectric 230 which may be a thermally grown or a high temperature deposited oxide.

FIG. 7 is an exploded view of transistor P.sub.1 under the NV storage conditions set forth in Table 1 with Vpp applied to terminal V.sub.1 and Vnn=Vss applied to terminal V.sub.2. The figure shows the band-to-band tunneling induced hot electron (BBHE) injection which occurs under these conditions. Holes 232 drift towards Vss and are pushed away from tunnel oxide 230 due to a positive Vpp voltage applied to the control gate 224 which couples to floating gate 226. The same positive bias attracts a large fraction of BBHE current (.apprxeq.10.sup.-2) compared to electrons 234 going to the n-well 214. Thus, the NV storage operation which selectively imbalances the threshold voltages of the PMOS transistors P.sub.1 and P.sub.2 of memory cell 100 includes creating an electric field within transistor P1 to inject hot electrons onto floating gate 226.

For an NVSRAM cell, a control gate 224 to floating gate 226 coupling ratio (KG) .gtoreq.0.7 can be achieved and during the NV storage operation the floating gate 226 will be at a high positive potential with respect to the drain 220. Thus, the drain to n-well junction sees a reverse-bias of Vpp. The drain junction and floating gate potentials cause an appreciable band-to-band tunneling current (.apprxeq.10-100 nA) to flow from the n-well 214 to the p.sup.+ drain 220. The holes 232 are swept to the p.sup.+ drain 220 biased at Vss. Some of the band-to-band tunneling induced hot electrons are injected through the tunnel dielectric 230 to the floating gate 226 while the rest of the BBHE are collected by the n-well 214 at +Vpp.

The BBHE injection mechanism has some key advantages compared to other methods such as conventional hot electron (CHE) injection and F-N tunneling. For example:

1. The high positive bias on the floating gate 226 and zero bias at the drain 220 sets up a high electric field E.sub.OX across the tunnel oxide 230. This aiding field injects hot electrons with a high injection efficiency .apprxeq.10.sup.-2 compared to 10.sup.-4 to 10.sup.-5 for p-channel or n-channel hot electron injection and 10.sup.-3 to 10.sup.-4 for F-N tunneling. The drain current can be quite low, e.g., of the order of <100 nA per cell.

2. For the same injected gate current Ig, E.sub.OX for BBHE injection can be about 35% lower compared to F-N tunneling. For example, E.sub.OX may be of the order of 7-8 MV/cm versus 12 MV/cm for F-N tunneling. Thus, the requirement for Vpp is at least 30% lower for BBHE injection.

3. Due to BBHE injection, V.sub.T of p-channel transistor P1 (V.sub.T P.sub.1) becomes more positive, pushing P.sub.1 more towards the conducting state. At the end of the storage phase, V.sub.T of P.sub.1 lies in the range V.sub.T P<VTP1<0 where V.sub.T P and V.sub.T P.sub.1 are negative. As explained later, monitoring of leakage current Ipp from Vpp, or alternatively the leakage current through transistor P1 at Vcc, allows the time of the storage phase (T.sub.STOR) to be selected such that V.sub.T of P.sub.1 lies in the range V.sub.T P<V.sub.T P1<0 where V.sub.T P is the threshold voltage of a charge-neutral PMOS stacked gate transistor. It is desired to maintain V.sub.T P.sub.1 negative at the end of the storage operation so that the current leaking through P.sub.1 and N.sub.1 from Vcc to Vss is kept small.

4. Because E.sub.OX at the maximum electron injection point is relatively low (E.sub.OX .apprxeq.7 MV/cm compared to >12 MV/cm for other methods for the same Ig), the endurance of the cell using BBHE injection is higher than using CHE or F-N tunneling.

FIG. 8 illustrates a cross-section along line B--B in FIG. 4 in another embodiment of the present invention. The illustration is for a triple well scheme. The NMOS transistor N.sub.2 is in a p-well 236 inside a deep n-well 238. This allows the voltage at terminal V.sub.2 to be pulled down to a negative voltage Vnn when the voltage at terminal V.sub.1 is raised to Vpp during NV storage and/or recall operations. Note that if n-well 238 were deleted, the scheme is the same as the one depicted in FIG. 6. Transistor N.sub.2 includes a gate structure 240 disposed over an active region 242 having a source 244 and a drain 246. Stacked gate transistor P.sub.2 may be formed in an n-well 248 disposed within p-substrate 202 and includes gate structure 250 disposed over active region 252. Active region 252 includes drain 254 and source 256. The gate structure 250 is made up of control gate 258 disposed over floating gate 260. As indicated above, floating gate 258 and control gate 260 may be poly-silicon structures. The control gate 258 and floating gate 260 are isolated by a thin poly-to-poly coupling dielectric 262 which may be an ONO stack or a deposited oxide, deposited at high temperature. Below floating gate 260 is a tunnel dielectric 264 which may be a thermally grown or a high temperature deposited oxide.

During the NV storage operation described in Table 1, the gate 250 of p-channel transistor P2 is at Vss. The channel is turned on and is at +Vpp. This will tend to discharge electrons from the floating gate 260, which is at low bias, by F-N tunneling to the channel at +Vpp. In other words, selectively imbalancing the threshold voltages of the PMOS transistors of cell 100 may include creating an electric field within transistor P.sub.2 to tunnel electrons off floating gate 260. Preferably, this electric field is created simultaneously with the electric field created in transistor P.sub.1 by applying the programming voltage to memory cell 100. The discharge current in transistor P.sub.2 will be larger if the floating gate 260 of P.sub.2 is charged with electrons.

Thus, at the end of an NV storage operation,

V.sub.T P.sub.2 =V.sub.T P-.DELTA.V.sub.t P.sub.2

V.sub.T P.sub.1 =V.sub.T P+.DELTA.V.sub.T P.sub.1 and V.sub.T P.sub.1 >V.sub.T P.sub.2 ; V.sub.T P.sub.1 -V.sub.T P.sub.2 .apprxeq.0.1 to 0.5 V

Since Vcc.ltoreq.Vpp/2, E.sub.OX during normal operation would be less than half of E.sub.OX during storage operation. The band-to-band tunneling current and BBHE injection would therefore be negligible. The floating gate of a p-channel transistor where V.sub.T is more positive than V.sub.T P is negatively charged leading to a larger E.sub.OX across the tunnel oxide from the floating gate to the p.sup.+ source which is at +Vcc. This would tend to leak the electrons in the floating gate by F-N tunneling current. This kind of disturb by F-N tunneling currents from a negatively charged floating gate to the p.sup.+ source at +Vcc, would tend to bring the V.sub.T of a p-channel transistor, initially >V.sub.T P, to V.sub.T P, the charge neutral V.sub.T of a PMOS transistor over a long period of time. During NV storage (actually standby) Vcc=0, E.sub.OX is small and there would be no such disturb because the F-N tunneling currents would be extremely small. Therefore the difference in the V.sub.T s of P.sub.1 and P.sub.2 created during storage operation would be maintained during power off periods. With respect to the normal SRAM operation, it should be noted that the voltages coupled from the control gates of the PMOS transistors P.sub.1 and P.sub.2 would override the imbalances created during storage operations.

The highest V.sub.T P is still less than 0V, i.e., it is negative. Therefore when the control gate voltage is equal to Vcc, the PMOS transistor would be off. Similarly, the change in VTP2 in the negative direction would be small. With the control gate voltage equal to Vss, the PMOS transistor would conduct.

The NV storage operation discussed above is further illustrated in the flow diagram of FIG. 9. The NV storage operation begins at step 300 and at step 302 the supply voltage is raised the from the operating voltage level (Vcc) to the programming voltage level (Vpp). By raising Vcc to Vpp, the VT of the "OFF" p-channel transistor (P.sub.1 in Table 1) is made less negative due to BBHE injection. The V.sub.T of the "ON" p-channel transistor (P.sub.2 in Table 1) is made more negative by F-N tunneling. This creates an imbalance in the PMOS V.sub.T 's which is maintained when power is removed from the memory cell.

As shown at step 304, the supply voltage is kept at Vpp until Ipp<Ipp.sub.1, where Ipp is the total band-to-band tunneling current drawn by the memory array from Vpp and Ipp1 is specified limit for Ipp. The band-to-band tunneling current has an exponential dependence on E.sub.OX. As the floating gate is charged with BBHE injected electrons, E.sub.OX decreases, reducing the band-to-band tunneling current. Simultaneously, V.sub.T P.sub.1 of the p-channel transistor increases. Therefore, the increase in VT and decrease in band-to-band tunneling current can be directly related and a limit Ipp.sub.1 determined for a specified V.sub.T P.sub.1. Ipp may be monitored while the supply voltage is equal to Vpp until Ipp reaches a preset limit (Ipp.sub.1) for array current leakage. This is a time period equivalent to T.sub.STOR shown in FIG. 5. After this condition is met, the storage process proceeds to step 306 where the supply voltage is lowered to Vcc (alternatively, power may be removed completely from the cell as shown in FIG. 5). This completes the storage operation (step 308). A recall operation may be performed as described with reference to FIG. 5 using a power up, dummy NV storage (following the steps of FIG. 9), power down and power up sequence to retrieve to the initial state of the cell before power was first turned off.

An alternative NV storage and recall scheme is illustrated in FIGS. 10A and 10B. In this scheme, the threshold voltages of the PMOS transistors of the memory cell are again selectively imbalanced by pulsing a supply voltage for the memory cell from an operating voltage level to a programming voltage level. This time, however, the pulsing operation may include repeatedly toggling the supply voltage between the operating voltage level (Vcc) and the programming voltage level (Vpp) for predetermined time intervals (t.sub.1) until the state of the memory cell is stored. The programming voltage level may be approximately twice the operating voltage level, or greater.

The storage operation begins at step 310 and at step 312 the supply voltage is pulsed from Vcc to Vpp for a time period t.sub.1. A check is then made at step 314 to determine if Icc>Icc.sub.1 where Icc.sub.1 is the upper limit for the leakage of the memory array at Vcc and is less than Isb, the standby leakage current specified for the device. The aforementioned leakage of the memory array is due to the subthreshold leakage of a p-channel transistor which increases as its V.sub.T is increased due to BBHE injection into the floating gate. The initial and increased subthreshold currents are depicted in FIG. 11. I.sub.CC1 is the sum of the subthreshold drain leakage for the array and can be directly related to the final V.sub.T P.sub.1.

If Icc is not >Icc.sub.1, the pulsing operation of step 312 is repeated until this condition is met, at which time the storage operation is completed at step 316. FIG. 10B illustrates the storage operation graphically. Further the illustration shows that the NV recall operation may be performed in a similar fashion to the process shown in FIG. 5 with an initial power up followed by a dummy storage operation and second power up to retrieve the originally stored state of the memory cell. Note that the dummy storage operation may include repeatedly toggling the supply voltage between the operating voltage level (Vcc) and the programming voltage level (Vpp) for predetermined time intervals (t.sub.1) using the scheme depicted in FIG. 10B until the state of the memory cell is stored, resulting in a controlled V.sub.T imbalance.

There is an important advantage to the NV recall sequence just described. With reference to Table 1 and FIG. 4, if during NV store operations electrons are injected into the floating gate of transistor P.sub.1, during the NV dummy store of the NV recall sequence electrons tend to be discharged by F-N tunneling. Instead BBHE injection occurs into the floating gate of transistor P.sub.2. Thus, one-half of the floating gates see charging and discharging of electrons (or discharging and charging for the other floating gate) for each store and recall operation. This prevents continuous charging of a floating gate of a storage element, regardless of the state of the memory cell being stored in each successive store operation. Thus, even if the same memory cell state (e.g., a "1" or a "0") is being stored in each successive store operation, the .DELTA.V.sub.T s (V.sub.T imbalance) of the p-channel storage transistors are switched to the opposite polarity during the dummy store operation in the NV recall cycle. The NV recall dummy storage tends to reset the V.sub.T shift which occurs during a store and prevents the V.sub.T of a storage element from being shifted continuously in one direction due to repetitive storage of the same memory cell state.

Thus, a non-volatile random access memory and methods for using same have been described. Although the foregoing description was set forth with reference to certain illustrated embodiments, it should be appreciated that the present invention is in no way limited to these examples and that the invention should only be measured in terms of the claims which follow.

Claims

What is claimed is:

1. A method of storing a state of a memory cell comprising the step of selectively imbalancing threshold voltages of storage elements of said memory cell by raising a supply voltage from an operating voltage level to a programming voltage level for a predetermined period of time sufficient to store said state of said memory cell as determined by monitoring a leakage current of a memory array including said memory cell from a source of said supply voltage at said programming voltage level.

2. A method as in claim 1 wherein the predetermined period of time is controlled by said monitoring such that said storage element of said memory cells do not enter a conducting state.

3. A method of storing a state of a memory cell comprising the step of selectively imbalancing threshold voltages of storage elements of said memory cell by repeatedly toggling a supply voltage for said memory cell between an operating voltage level and a programming voltage level for predetermined time intervals until said state of said memory cell is stored.

4. A method as in claim 3 wherein said step of repeating toggling said supply voltage is performed a number of times according to a leakage current level determined by monitoring a leakage current of a memory array including said memory cell from a source of said supply voltage at said operating voltage level.

5. A method as in claim 4 wherein the number of times said step of toggling is performed is controlled by said step of monitoring said leakage current such that said storage elements of said memory cells do not enter a conducting state.

6. A method as in claim 1 wherein said programming voltage level is approximately twice said operating voltage level or greater.

7. A method as in claim 1 wherein said step of selectively imbalancing threshold voltages further comprises the steps of: creating a first electric field within a first of said storage elements to tunnel electrons off a floating gate of said first storage element; and creating a second electric filed within a second of said storage elements to inject electrons onto a floating gate of said second storage element.

8. A method as in claim 7 wherein said first and said second electric fields are created simultaneously.

9. A method as in claim 8 wherein said programming voltage level is approximately twice said operating voltage.

10. A method comprising: raising a supply voltage to a memory cell from an operating voltage level to a programming voltage level to store a first state of said memory cell; removing said supply voltage from said memory cell; energizing said memory cell to said operating voltage level to recover a second state of said memory cell, said second state being a logical inverse of said first state; and repeatedly toggling said supply voltage between said operating voltage level and said programming voltage level to recover said first state of said memory cell.

11. A method comprising raising a supply voltage to a memory cell from an operating voltage level to a programming voltage level to store a first state of said memory cell; removing said supply voltage from said memory cell; and selectively imbalancing threshold voltages of storage elements of said memory cell in a dummy storage operation to recall said first state of said memory cell.

12. A method as in claim 11 wherein said dummy storage operation imbalances said threshold voltages of said storage elements in a direction opposite to an imbalance created during said step of raising a supply voltage to a memory cell from an operating voltage level to a programming voltage level to store a first state of said memory cell.

13. A memory comprising a memory cell having a stored state, which is the result of a programming operation wherein threshold voltages of storage elements of the memory cell were selectively imbalanced as the result of a supply voltage of the memory cell being repeatedly toggled between an operating voltage level and a programming voltage level for predetermined time intervals.

14. A memory as in claim 13 wherein said storage elements comprise a pair of stacked gate transistors.

15. A memory as in claim 14 wherein each of said stacked gate transistors is fabricated in an n-well of a p-type semiconductor substrate.

16. A memory as in claim 15 wherein said semiconductor substrate further includes transistors comprising latch elements of said cell.

17. A computer system comprising the memory of claim 13.

18. A method as in claim 3 wherein said step of selectively imbalancing threshold voltages further comprises the steps of: creating a first electric field within a first of said storage elements to tunnel electrons off a floating gate of said first storage element; and creating a second electric filed within a second of said storage elements to inject electrons onto a floating gate of said second storage element.

19. A method as in claim 18 wherein said first and said second electric fields are created simultaneously.

Patent Citations (10)

Patent	Date	Inventor
USH1414	1995-02-01	Borgen
US4354255	1982-10-01	Stewart
US4510584	1985-04-01	Dias et al.
US4538246	1985-08-01	Wang et al.
US4638465	1987-01-01	Rosini et al.
US5353248	1994-10-01	Gupta
US5365475	1994-11-01	Matsumura et al.
US5523971	1996-06-01	Rao
US5648930	1997-07-01	Randazzo
US5774397	1998-06-01	Endoh et al.

Non-Patent Literature (2)

Christian E. Herdt et al., "A 256K Nonvolative Static RAM", Simtek Corporation, No. 5.3, pp. 1-4 (1995).
T. Ohnakado et al., "Novel Electron Injection Method Using Band-to-Band Tunneling Induced Hot Electron (BBHE) for Flash Memory with a P-Channel Cell", IEDM 95-279, pp. 11.5-11.5.4 (1995).

Abstract

Description