BACKGROUND
1. Field of Invention
This invention relates to phase modulation of electromagnetic and/or acoustical wavefronts using surface deformation type phase modulators.
2. Description of Prior Art
Prior art concerning surface deformation type phase modulators will be broadly classified into two categories. Those devices using monolithic phase modulating media, and those devices using discrete elements. Examples of monolithic phase modulating include oil films, elastomer layers, piezoelectric media, glass substrates, and thin membranes. Devices employing monolithic media exhibit deformations which are non-localized. This is undesirable since it imposes a limit on spatial resolution.
Discrete element modulators offer a device philosphy amenable to isolation, thereby permitting high spatial resolution. Previous discrete element modulators utilizing piezoelectric shear mode elements include U.S. Pat. No. 3,544,202 to Fowler, Dec. 1, 1970 and U.S. Pat. No. 4,736,132 to Culp, Apr. 5, 1988. In both of these configurations, one electrode functions as a motion constraint by affixing it to a rigid support structure. Separate surfaces are dedicated to the phase modulation and electrode functions. This mounting technique is limited in how it may influence the stress distribution in the piezoelectric element.
In discrete, closely packed arrays, adjacent elements must be electrically isolated. In U.S. Pat. No. 4,736,132, to achieve electrical isolation, a restriction must be placed on the potential that can be applied to adjacent electrodes or at least one additional electrical insulator must be added between adjacent electrodes. Using the latter approach adds fabrication steps and reduces spatial resolution of the array. This is contrary to the philosophy of discrete element arrays. Restricting the potentials applied to adjacent electrodes under utilizes device capability. Furthermore, the support structure of U.S. Pat. No. 4,736,132 provides no assistance in isolating adjacent electrodes.
Shear mode actuators have been utilized in other applications unrelated to phase modulation of electromagnetic wavefronts. Examples include U.S. Pat. No. 4,879,568 to Bartky et al, Nov. 7, 1989.
The shear mode actuators of U.S. Pat. No. 4,879,568 must provide a sealed channel for use as an ink jet droplet generator. As identified in FIGS. 2(a) and 3(a), a compliant strip seal 54 and a continuous compliant strip seal 541 are essential components for this application. As to be identified herein, no such components are required in wavefront phase modulator configurations. Consequently, U.S. Pat. No. 4,879,568 would contain extraneous components if this configuration were contemplated for a new use application involving wavefront phase modulation. Such extraneous components hinder wavefront phase modulator performance. Dual end constraints, necessary for a sealed channel, exist in some form in the remaining embodiments of U.S. Pat. No. 4,879,568.
In addition, no provisions are provided for an optically reflective surface to phase modulate an incident wavefront. As well understood by those knowledgeable in the state of the art, optically reflective surfaces could be metal, but not all metal surfaces are optically reflective surfaces, i.e. gold strongly absorbs in certain "optical" portions of the electromagnetic spectrum. Specifying metal electrodes is not a sufficient condition for producing optically reflective surfaces. Such a specification could severely restrict the spectral flexibility of deformable mirror spatial light modulators. Not specifying an optically reflective surface renders this device dubious for wavefront phase modulator applications.
Furthermore, as well understood by those knowledgeable in the state of the art, no optically reflective surface provisions are identified for the surface most effective for phase modulation in the embodiment illustrated in FIGS. 6(a) or 6(b). Not identifying an optically reflective surface for use in this application renders this embodiment unsuitable for use in wavefront phase modulators. Not maintaining a consistent, suitable set of requirements, suggests that U.S. Pat. No. 4,879,568 was not contemplated for use as an electromagnetic wavefront modulator.
No suitable one or two dimensional wavefront modulator array configurations are available in U.S. Pat. No. 4,879,568. Linear arrays of shear mode actuators are identified in FIG. 9(a). Adjacent shear mode actuators are displaced perpendicular to the surface, when the elements are unenergized, which would be most effective in phase modulation applications. This superimposes all metal electrodes. If a wavefront to be modulated were incident on a metal electrode of an exposed shear mode element, then, due to the nature in which the remaining elements are arranged in FIG. 9(a), the exposed element would eclipse the remaining elements, rendering them useless in phase modulation applications. Two dimensional arrays formed from a plurality of such one dimensional arrays would not be capable of phase modulation in two spatial degrees of freedom. No suitable spatial distribution of shear mode actuators has been identified in U.S. Pat. No. 4,879,568 which could allow shear mode elements to effectively, efficiently, and consistently function as linear or two dimensional wavefront phase modulators involving electromagnetic and/or acoustic wavefronts.
Since U.S. Pat. No. 4,879,568 is plagued by extraneous components, no acceptable and/or an inconsistent definition of optically reflective surfaces and an unsatisfactory spatial distribution of shear mode elements for use in linear and/or two dimensional phase modulators, U.S. Pat. No. 4,879,568 is deemed unacceptable for new use applications involving phase modulation of electromagnetic and/or acoustic wavefronts.
The pitfalls of U.S. Pat. No. 4,879,568 are shared by other ink jet droplet generators.
OBJECTS AND ADVANTAGES
Accordingly, several objects and advantages of my invention are:
(a) to introduce a new mounting technique for piezoelectric shear mode elements.
(b) to introduce a variable of the mounting technique that can be utilized to influence stress distribution in the shear mode element.
(c) to utilize geometry available in the mounting technique to couple piezoelectric shear mode elements.
(d) to show how the electrode geometry associated with this mounting technique can reduce signal interference between elements of an array.
(e) to increase functionality of the support structure by having it also serve as an electrical insulating element without reducing spatial resolution of the array.
(f) to increase the functionality of the electrodes by having them also serve as phase modulating elements.
(g) to improve controllability of the phase modulating elements with a minimum number of components and no operational restrictions so as to enhance commercial viability of the phase modulator.
Further objects and advantages of my invention will become apparent from consideration of the drawings and ensuing description of it.
DRAWING FIGURES
In the drawings, closely related figures have the same numbers but different alphabetic suffixes.
FIG. 1 is a perspective view of a two dimensional array containing a plurality of constrained shear mode modulating elements. All elements are in an unenergized state.
FIG. 2 is a perspective view of a single constrained shear mode modulating element in an unenergized state.
FIG. 3 is a perspective view of a single constrained shear mode modulating element in an energized state.
FIG. 4 is a perspective view of a support structure modified to improve electrical isolation in the array.
FIG. 5 is a perspective view of an array column whose reflective electrodes have an overhang.
FIG. 6 is a perspective view of a single modulating element illustrating a degree of freedom available in determining the orientation of the reflective electrode.
FIG. 7 is a perspective view of a single modulating element in an unenergized state, having an initial angular offset.
FIG. 8 illustrates how modulating elements may be coupled. The device is in an unenergized state.
FIG. 9 illustrates coupled modulators in an energized state and is referred to as the Draw Bridge Modulator.
REFERENCE NUMERALS IN DRAWING
10--constrained piezoelectric shear mode modulating element
12--electrically insulating support structure
14--ridges
16--buss bar
18--piezoelectric block
20--piezoelectric polarization direction of block 18
22--left end surface of block 18
24--flexible reflective electrode
26--top surface of block 18
28--flexible conductor
30--second electrode
32--bottom surface of block 18
34--external contact electrode
36--perforation
38--right end surface of block 18
40--wells
42--side wall of well 40
44--overhang
46--insulating rigid spacer
DESCRIPTION FIGS. 1-9
FIG. 1 is a perspective view of an array containing a plurality of constrained piezoelectric shear mode modulating elements, generally designated as 10. An electrically insulating support structure 12 contains ridges 14. Each and every element 10 of the array is affixed to a ridge 14. A buss bar 16 is affixed to the top of ridge 14 to provide a common electrical potential to all elements 10. Arrows PY and PX indicated the spatial period of the two dimensional array.
Ridges 14 may be fabricated in a number of ways. Ridges 14 could be deposited or grown on structure 12. Structure 12 could be selectively etched to generate the surface profile. Applications for the device are many, and should influence fabrication methods and material selection. For instance, when employing an electrical addressing scheme using an electron beam, thermal isolation of element 10 from structure 12 may be important. Spatial resolution requirements further influence approaches. Structure 12 could be a photosensitive glass which can be chemically etched. Such a glass could be FOTOCERAM. FOTOCERAM is a trade name of Corning Inc., Corning N.Y. Metal Working tools and techniques could be used on machinable glass cermaic. Such a machinable glass ceramic could be MACOR. MACOR is a trade name of Corning Inc., Corning N.Y. MACOR is comprised of a fluorophlogopite mica phase (55%) interspersed in a borosilicate glass matrix (45%). The low thermal conductivity of MACOR makes it ideal for use in thermal isolation of element 10.
A designed-space forming process using ceramic green sheets can be used to make fine spaces accurately in ceramics. Such a process is described in the article "Applications of Designed-Space Forming Technology." by Kazuaki Utsumi et al, Proceeding of the 6th meeting on Ferroelectric Material and Their Application, Kyoto 1987, Japanese Journal of Applied Physics, Vol. 26 (1987) Supplement 26-2, pp 53-56. Excimer-laser induced etching may be used to assist in fabricating the device. Visible Ar.sup.+ and Kr.sup.+ laser radiation may be employed in H.sub.2 atmospheres for etching grooves and holes. References include "Excimer-laser-induced etching of ceramic PbTi.sub.1-x Zr.sub.x O.sub.3." by M. Eyett et al, J. Applied Phys. Vol. 62, No. 4, Aug. 15, 1987, 1511-1514, and "Laser-Induced Chemical Etching of Ceramic PbTi.sub.1-x Zr.sub.x O.sub.3." by Eyett et al, Appl. Phys. A40, 235-239 (1986).
Microstructures in Silicon may be fabricated with an anisotropic chemical etching of the three major orientations of Silicon in KOH/H.sub.2 O. Polycrystalline Silicon microstructures can be fabricated on Silicon substrates by etching an underlying oxide layer. Electrostatic bonding of glass or other ceramic materials to metal, Silicon or Gallium Arsenide can fulfill many of the requirements for bonding and mounting micromechanical structures. References include "Polycrystalline Silicon Microstructures," R. T. Howe Micromachining and Micropackaging of Transducers edited by C. D. Fung, P. W. Chung, W. H. Ko, and D. G. Fleming, "Orientation of the Third Kind: The Coming of Age of (110) Silicon" by Don L. Kendall and G. R. deGuel, Micromachining and Micropackaging of Transducers, "Bonding Techniques for Microsensors" by W. H. Ko, J. T. Suminto, and G. J. Yeh, Micromachining and Micropackaging of Transducers.
FIG. 2 is a perspective view of a single element 10 in an unenergized state. Element 10 contains a piezoelectric block 18.
Block 18 is piezoelectrically polarized in one of the two directions indicated by arrows 20. A left end surface 22 of block 18, intercepts polarization direction 20 of block 18. Surface 22 is affixed to ridge 14. A flexible reflective electrode 24 is affixed to a top surface 26 of block 18. A flexible conductor 28A connects buss bar 16 to electrode 24. Alternativily electrode 24 may be extended to make the connection to buss bar 16. A second electrode 30 is affixed to a bottom surface 32 of block 18. Surface normals to surface 26 and 32 are perpendicular to polarization direction 20. Surfaces 26 and 32 are parallel planes. An external contact electrode 34 is embedded in a perforation 36 of structure 12. Flexible conductor 28B connects electrode 34 to electrode 30. Right end surface 38 has no motion constraint.
Perforation 36 could be generated by CO.sub.2 laser drilling of glass, or any of the previously mentioned techniques. Additional reference includes "Electrical Contacts to Implated Integrated Sensors by CO.sub.2 Laser Drilled Vias Through Glass" by Lyn Bownan, Joseph M. Schmitt, and James D. Meindl, Micromachining and Micropackaging of Transducer.
Materials used by block 18 could be Lead Zirconate Titanate, Zinc Oxide, Barium Titanate, Lead Titanate, Polyvinylidene Flouride, Lithium Niobate. If material selection for block 18 requires poling, polarization direction 20 may be achieved by several techniques. Grooves may be etched in ridges 14. A conductive material can be deposited in the grooves. These may now serve as poling electrodes. Upon completion of poling operations, these electrodes are removed and the grooves filled. Alternatively, a device similar to that described in the article "Continuous Poling of PZT Fibers and Ribbons and its Application to New Devices.", by T. R. Gururaja et al, Ferroelectrics, 1983, Vol 47, pp 193-200 may be used. The effectiveness of this type of approach depends on the thickness of block 18. Guidelines are provided in the reference.
Techniques for influencing the crystallographic orientation of thin films exists and include U.S. Pat. No. 3,558,351 to Foster, Jan. 26, 1971 and the article "Fabrication and Application of Piezo and Ferroelectric Films" by Abhai Mansingh, Ferroelectrics, 1990, Vol. 102, pp 69-84.
FIG. 3 shows a single shear mode modulating element 10 in an energized state. A variable .theta. is used to characterize the surface profile. As shown, electrode 24 (and electrode 30) possess a thickness t and a surface area associated with dimensions x and y.
Referring to FIG. 1, electrode geometry of my invention aids in electrical isolation of elements 10. As illustrated, adjacent electrodes 24 are held at a common potential. No electrical interference exists, and maintaining a common potential on each and every element 24 does not restrict phase modulation capabilities of element 10.
In the array depicted in FIG. 1, adjacent electrodes 30 have a side area of (t) (x) exposed to its neighbor. In U.S. Pat. No. 4,736,132, FIG. 5, adjacent electrodes have the surface area of its face exposed to its neighbor. This situation exists for both outer electrodes of U.S. Pat. No. 4,736,132. In many applications, electrode thickness t will be less than dimensions x or y. Side area exposure will be less than face area exposure. In my invention, electrical interference is controlled by a geometry which confines interference to one electrode, and then reduces the exposed area to minimize the problem.
FIG. 4 shows how structure 12 may be modified to provide additional electrical isolation between adjacent electrodes 30. Wells 40 are formed in structure 12, for each and every element 10. A side wall 42 of well 40 acts as an electrical insulator between adjacent electrodes 30. Perforations 36 are located in the buttom of well 40. Element 10 is affixed to ridge 14 in a manner that recesses electrode 30 in well 40. Dimensions of well 40 are chosen so no mechanical interference exists with element 10 over the angular range of travel of element 10.
FIG. 5 shows how to effectively utilize the spatial period of an array in the presence of side walls 42. Dimensions of reflective electrode 24 are chosen to meet spatial resolution requirements for an application. Block 18 has reduced dimensions in comparison to electrode 24, creating an overhang 44. Wells 40 are dimensioned to accommodate block 18. The increased spacing between blocks 18 due to thickness of side wall 42 is compensated by overhang 44.
Further flexibility exists in how elements 10 may be configured. FIG. 6 shows how element 10 may be rotated about its polarization direction 20 to establish a new orientation for electrode 24. FIG. 6 illustrates a 90 degree rotation; however, any angular value is permissible. Surface normals of electrode 24 and electrode 30 are perpendicular to polarization direction 20. After a 90 degree rotation, top surface 26 and bottom surface 38 of FIG. 2, could now be described as a front surface and a back surface. Block 18 contains two sets of parallel planar surfaces that may be used to interface electrode 24 and electrode 30.
FIG. 7 shows element 10 in an unenergized state having an initial tilt orientation of .theta.. Such an orientation may be achieved in an unenergized state by cleaving surface 22. Surface 22 intercepts polarization direction 20. A surface normal to ridge 14 will form an acute angle with direction 20. Block 18 may be rotated about direction 20 to further extend the latitude available in determining the orientation of electrode 24. These configuration options can be used to influence the stress distribution in element 10, which will influence the phase modulation capabilities of electrode 24.
FIG. 8 shows how a second element 10B may be coupled to a first element 10A. Left end surface 22B is affixed to right end surface 38A. An electrically insulating rigid spacer 46 may be used to isolate electrodes 30A and 24A from electrodes 30B and 24B, respectively. In FIG. 8, electrodes 30A and 30B are shown having a common potential due to flexible conductor 28D. Any of the previously discussed degrees of freedom may be employed in this configuration. The polarization directions for elements 10A and 10B may be selected independently and could be anti-parallel. Piezoelectric materials used for blocks 18A and 18B could be different. A flexible electrical conductor 28C maintains electrodes 24A and 24B at a common potential. This configuration maximizes the percentage of the spatial period attributed to a reflective electrode while confining electrode exposure area to one electrode. The form of 28B is changed from previous illustrations, but its function remains the same.
FIG. 9 illustrates an energized state of two coupled elements. This configuration will be referred to as the Draw Bridge Modulator. A single electrode 24C and a single electrode 30C are used in this configuration. If polarization directions 20A and 20B are anti-parallel when in an unenergized state, then a large rate of change will occur in electrode 24 when the Draw Bridge Modulator is energized.
The anti-parallel directions 20A and 20B could be generated by a suitable heat treatment of Lithium Niobate as described in the article "Hysteresis-Free Piezoelectric Actuators Using LiNbO.sub.3 Plates with a Ferroelectric Inversion Layer" by K. Nakamura and M. Smimizu, Ferroelectrics, 1989, Vol. 93, pp. 211-216.
The preferred embodiment of my invention is the configuration of FIG. 9, blocks 18A and 18B having anti-parallel polarization directions when in an unenergized state, formed from a ferroelectric inversion layer, using the support structure 12 described in FIG. 4, with electrode 24 having overhang 44.
Theory of Operation
Referring to FIG. 2, a voltage is applied across buss bar 16 and electrode 34. This will establish an electric field in block 18. The electric field is parallel to the surface normals of electrode 24 and electrode 30. The direction or sense of the electric field is determined by the polarity of the applied voltage. This electric field is perpendicular to the polarization direction 20 of block 18. Piezoelectric block 18 is mounted in a cantilever fashion by having surface 22 affixed to rigid 14. Flexible conductors 28A and 28B impose no motion constraint on element 10. This configuration results in a piezoelectric boundary value problem. References for addressing simulation of these issues include the article "Simulation of Elastic Stresses and Polarization in Piezoelectric Ceramic by the Finite Difference Method" by W. B. Carlson and M. Kahn, Ferroelectrics, 1989, Vol. 99, pp. 165-172. Upon application of the voltage to electrodes 34 and buss bar 16, the element 10 and consequently electrode 24 will undergo a deflection. Referring to FIG. 3, the variable .theta. may be used to characterize the deflection curve of electrode 24.
The characteristic profile of the deflection curve for electrode 24 is a function of the magnitude of the applied voltage. Changing the magnitude of the applied voltage will change the characteristic profile. Reversing the polarity of the applied voltage will also effect the characteristic profile. Reversing the polarization direction 20, will, upon application of the applied voltage, effect the characteristic profile of electrode 24.
Referring to FIG. 1, if an electromagnetic and/or acoustical wavefront is incident upon the reflective electrode 24, a phase modulation dependent upon the characteristic profile of electrode 24 will be imparted to the wavefront. In this fashion, the applied voltage controls the phase modulation. A consideration when using a plurality of elements in an array is to avoid mechanical interference between the elements. This is straight forward for the degree of freedom identified in FIG. 1.
FIG. 7 shows how stress at a boundary may be effected. This is an important consideration when attempting to optimize a characteristic profile for a particular modulation application. Operation of this configuration is similar to that previously described.
In FIGS. 5-6, 8-9, additional factors already described are included to further influence the characteristic profile generated when a voltage is applied across electrode 34 and buss bar 16. Operation is similar to that previously described.
Summary, Ramifications and Scope
Thus the reader can see that the phase modulator of this invention does not require operational compromises in spatial resolution and/or electrical controllability to be fully implemented. Functionality of components is increased by having them serve dual roles as in the case of a reflective electrode or the support structure providing electrical isolation between adjacent electrodes of an array.
Furthermore, the mounting technique provides a means to influence the characteristic profile of the reflective electrode to assist in determining the phase modulation characteristics for a particular application. The mounting technique allows elements to be coupled to generate large rates of change in the characteristic profile of reflective electrodes.
While my above description contains many specificities, these should not be construed as limitations on the scope of the invention, but rather as an exemplification of one preferred embodiment there of. Many other variations are possible. The interface surface between a ridge and a piezoelectric block may be non-planer to further influence the stress distribution in the piezoelectric element, lending more degree of freedom to influence the characteristic profile of the reflective electrode. Poling techniques could influence what angle the polarization directions make with the normal to a ridge.
Accordingly, the scope of the invention should be determined not by the embodiments illustrated, but by the appended claims and the legal equivalents.