US 4,706,492 AGrant
Method and Apparatus for Determining Real Gas Effects in Critical Flow Nozzles
Issue Date:1987-11-17
•6 Claims
•2 Drawing Sheets
Abstract
A method and apparatus for determining the gas flow rate in a high pressure critical flow nozzle is disclosed. A high pressure gas flows through a first critical flow nozzle. Upstream of the first critical flow nozzle a small slip-stream of gas is removed and flows through a smaller second critical flow nozzle. The small second critical flow nozzle drops the pressure of the gas to a low level. This flow rate of this low pressure gas stream is measured in a highly accurate low pressure gas flow rate measuring device. Since the flow rate in this device must be the same as that of the second critical flow nozzle, a correction factor can be calculated for the second critical flow nozzle. This flow rate correction factor will be the same for the first critical flow nozzle.
Metadata
Assignee
- Chevron Research Company
Inventors
- Emrys H. Jones, Jr.
- Robert E. Jackson
Application Information
Application Number:US 8747318
Filing Date:1986-06-16
Priority Date:1986-06-16
Art Unit:265
Classifications
IPC:
G01F 2500
Field of Search:
733;196;861.61
Patent Drawings (2 sheets)
Description
Background of the Invention
This invention pertains in general to a method and means for accurately determining the flow rate of gas through a pipe. More specifically, the present invention describes a method and apparatus for determining to a high degree of accuracy the flow rate of high pressure natural gas through a pipeline by means of critical flow nozzles.
In the purchase and sale of natural gas, extremely large volumes of natural gas are continuously purchased and sold. Sales meters are installed in the gas lines to measure the volume of gas passed through the line and, thus, determine the amount of money which must be paid for the gas. Because tremendous volumes of gas are being purchased and sold, errors of only a few tenths of a percent in the meters can result in million of dollars in over or under payment over a long period of time.
In order to calibrate these sales meters, a "critical flow nozzle" can be used in series with the sales meter for a short period of time, i.e., a nozzle in which the gas reaches supersonic speeds in the nozzle. As is well known to one skilled in the art, the gas flow rate through a critical flow nozzle is dependent only on the pressure and temperature upstream of the nozzle and the thermodynamic properties of the gas. Using equations well known to one skilled in the art, the gas flow rate through a critical flow nozzle can, therefore, be easily determined. A gas meter in series with a critical flow nozzle can, therefore, be easily calibrated.
The equations for the flow rate through a critical flow nozzle for some gas mixtures are highly accurate. However, some gas mixtures do not have an accurate equation of state. At extremely low pressures, the ideal gas law is an adequate equation of state. Various equations are known which account for the increased molecular interactions occurring at higher pressures. At very high pressures, even the most sophisticated of these equations become somewhat questionable. Further, when a complex mixture of gases (such as natural gas) is being measured, these equations become increasingly unreliable. These problems are further complicated when highly polar molecules are present, such as CO.sub.2 and H.sub.2 S. As petroleum reserves are depleted, natural gases containing higher percentages of these components are being produced.
Brief Description of the Invention
Accordingly, the present invention provides a method and means for providing a highly accurate determination of the gas flow rate through a critical flow nozzle in a high pressure gas pipeline by providing a highly accurate correction factor to the equation of state. A small slipstream of gas is removed upstream of the primary critical flow nozzle. This slipstream of gas flows through a first critical flow nozzle sized to reduce the gas pressure to a very low level. The slipstream of gas then flows through a second flow measuring device (which may be an orifice plate, another critical flow nozzle or another type of flow measurement device). Since the gas stream is now at low pressure, the flow rate can be readily determined because a low pressure equation of state can be used.
Since the mass flow rate in the first slipstream critical flow nozzle must be the same as that of the downstream measurement device, a "correction factor" can be determined for the upstream critical flow meter to correct the well-known critical flow nozzle equation for real gas effects. This correction will be the same for the critical flow nozzle that is used for calibration of the sales gas meter since the gas composition and the upstream pressure and temperatures are the same for both the primary and the slipstream nozzles.
Brief Description of the Drawings
FIG. 1 is a diagrammatic partial cross-section of the apparatus used according to the present invention.
FIG. 2 is a diagrammic partial cross-section of one embodiment of the apparatus used according to the present invention.
Description of the Preferred Embodiment
As illustrated in FIG. 1, the apparatus for determining real gas effects 12 includes a first critical flow nozzle 1 that is used to measure the rate at which natural gas 2 is flowing through a pipeline 3. The temperature and pressure of the gas are measured with an upstream temperature measuring device 4 and an upstream pressure measuring device 5.
A slipstream of gas 6 flows through a branch line 7 and than through a second critical flow nozzle 8. The second critical flow nozzle 8 is sized such that the downstream pressure will be relatively low (e.g., less than 100 pounds per square inch absolute, but preferably around 20 psia). Downstream of the second critical flow nozzle, a midstream temperature measuring device 9 and a midstream pressure measuring device 10 measure the temperature and pressure of the gas. The slipstream of gas 6 then flows through a low pressure gas flow rate measurement device 11. In the preferred embodiment, this device is another critical flow nozzle, although it may be another type of flow measurement device, such as an orifice plate equipped with a differential pressure indicator, a venturi meter, a Bell prover, etc. This meter should, however, have accuracy equal to or greater than the desired accuracy of the primary nozzle.
After passing through the low pressure metering device, the gas flows to the atmosphere, to a vapor recovery system or to another low pressure sink.
The dimensions of the various pieces of equipment will vary from situation to situation, but can easily be determined by one skilled in the art. The size and shape of the critical flow nozzles will depend upon several factors, including the line size, the gas pressures, the gas temperature, and approximate flow rate. Standards for the sizes and shapes of the nozzles are well known in the art. Adequate distances should also be allowed between any upstream obstructions and the various critical flow nozzles and pressure measurement devices to prevent disturbance effects. Again, these distances would be different for each design, but can be easily determined by one skilled in the art.
Since the low pressure critical flow nozzle 11 is operating at nearly atmospheric pressure, the flow rate through this nozzles can be accurately determined using readily available, ideal computation methods when the midstream pressure and temperature and gas composition are known, along with the nozzles' physical characteristics. The gas composition can also be readily determined by analytical methods readily known to one skilled in the art.
As shown in FIG. 2, in one embodiment, the low pressure gas measuring means can be an accurate low volume proving meter 15.
In the preferred embodiment, the program described by R. C. Johnson ("Tables of Critical Flow Functions and Thermodynamic Properties for Methane and Computational Procedures for Both Methane and Natural Gas", NASA Special Report, NASASP-3074) is used to calculate the flow rate through the first critical flow nozzle 1 and the second flow nozzle 8 and the low pressure critical flow nozzle 11. Since the upstream pressure for the first critical flow nozzle and the second critical flow nozzle is extremely high and components may be present in the gas which are not well characterized at high pressure, it is likely that there will be significant errors in the flow rate calculation from these meters. However, it is known that the mass flow rate of gas through the second critical flow nozzle must be the same as that through the low pressure measurement device. Therefore, let:
where:
M=Actual flow through the low pressure meter 11.
M.sub.2c =Calculated flow through the second critical flow nozzle 8.
C.sub.RG =Real Gas coefficient.
M.sub.2 =Actual mass flow through the second critical flow meter.
Rearranging:
Since the first critical flow nozzle 1 operates at the same upstream pressure and temperature as the second critical flow, nozzle 8, the actual flow rate through the first critical flow nozzle 1 can be calculated using the same real gas coefficient, i.e.:
where:
M.sub.1 =Actual mass flow through the first critical flow nozzle 1.
M.sub.1c =Calculated flow through the first critical flow nozzle 1.
Of course, the mass flow rate entering the calibration apparatus 2 will simply be the sum of the mass flow rates through the first critical flow nozzle and the low pressure measurement device 11, i.e.:
where:
M.sub.T =the total mass flow rate of gas entering the apparatus.
While the present invention has been described in terms of a preferred embodiment, further modifications and improvements will occur to one skilled in the art. It is to be understood, therefore, that the invention is not limited to the above-discussed embodiment but to the appended claims.
Claims
What is claimed is:
1. Apparatus for determining the gas flow rate of a high pressure gas through a critical flow nozzle comprising: a first critical flow nozzle in a high pressure gas flow line; a branch line, said branch line upstream of said first critical flow nozzle, of significantly smaller diameter than said gas flow line, and tubularly connected to said gas flow line; a second critical flow nozzle, said second critical flow nozzle located in said branch line; a low pressure gas flow measuring means, said low pressure gas measuring means downstream of said second critical flow nozzle in said branch line; a first pressure measuring means, said first pressure measuring means located in said gas flow line upstream of said first critical flow nozzle, whereby a pressure within the flow line can be determined; and a first temperature measuring means, said first temperature measuring means located in said gas flow line, whereby a temperature in said gas flow line can be determined.
2. Apparatus as recited in claim 1 wherein: said low pressure gas flow measuring means is a third critical flow nozzle; a second pressure measuring means is located in said branch line, upstream of said third critical flow nozzle, and downstream of said second critical flow nozzle; and a second temperature measuring means is located in said branch line upstream of said third critical flow nozzle and downstream of said second critical flow nozzle.
3. Apparatus as recited in claim 1 wherein: said low pressure gas measuring means is an accurate low volume proving meter.
4. Apparatus for calibrating a gas metering device comprising: a first critical flow nozzle, said critical flow nozzle located in a gas flow line downstream of a meter to be calibrated; a branch line, said branch line downstream of said meter and having a substantially smaller diameter than said gas flow line and tubularly connected to said gas flow line; a second critical flow nozzle, said second critical flow nozzle located in said branch line; a gas flow rate measuring means, said gas flow rate measuring means located in said branch line, downstream of said second critical flow nozzle; a first pressure measuring means located in said flow line, upstream of said first critical flow nozzle; and a first temperature measuring means located in said flow line upstream of said first critical flow nozzle.
5. Apparatus as recited in claim 4 wherein: said gas flow rate measuring means is a third critical flow nozzle; a second pressure measuring means is located in said branch line, downstream of said second critical flow nozzle, upstream of said third critical flow nozzle; and a second temperature measuring means is located in said branch line, downstream of said second critical flow nozzle, upstream of said third critical flow nozzle.
6. Apparatus as recited in claim 4 wherein: said gas flow rate measuring means is a meter prover.
Patent Citations (11)
Non-Patent Literature (2)
- "Tables of Critical Flow Functions and Thermodynamic Properties for Methane and Computational Procedures for both Methane and Natural Gas"; NASA Special Report, NASA SP-3074, 174 pages, Robert C. Johnson, published 1972.
- "An Accurate Gas Metering System for Laminar Flow Studies"; The Review of Scientific Instruments, vol. 20, No. 1, pp. 61-66; Jan. 1949; J. W. Andersen et al.