Moisture Tester

The present invention is directed generally to the area of test apparatus and more particularly to a moisture tester for determining the moisture content of materials such as grains.

Testing the constituent contents, and especially the moisture content of various agricultural grain products is well known. The prior art has devised a number of novel apparatus for more or less automating the moisture content determination procedure. In this regard, it is desirable in many applications to test the moisture content of a great number of samples of grains in a minimum amount of time.

One particularly successful prior art device is the "model 919".TM. moisture meter manufactured by Motomco, Inc. This moisture tester essentially determines the moisture content of a sample of material by determining its dielectric constant or capacitance. In this regard, a premeasured quantity of material is fed to a test cell which essentially comprises a capacitor. Since, the capacitance value of the test cell is determined by the dielectric properties of the sample of material contained therein, the capacitance of the material itself may be inferred from the observed change in capacitance over that of the empty test cell.

More specifically, the foregoing prior art device utilized a substitution method for obtaining the moisture content of the material. That is, the capacitance value of the test cell itself is initially determined, and thereafter a sample of material is introduced into the test cell, whereupon the capacitance thereof is again determined. Hence, the change in capacitance may be attributed to the sample of material, whereby its moisture content may be determined on the basis of known correlations between dielectric properties and moisture content for each particular material. These known correlations have been determined by empirical studies for each of a plurality of different grain materials.

Still more particularly, the prior art method utilized a balanced oscillator approach, whereby the test cell was included in the tank circuit of one oscillator, which was then "balanced" by means of a variable capacitor with a relatively stable reference oscillator. Accordingly, the circuit was once balanced with the empty test cell and again balanced with the sample of material to be tested residing in the test cell. Thereupon, the difference in capacitance value of the variable capacitor at each balance or "null point" could be taken as equal to the capacitance value and hence moisture content of the sample of material.

While the foregoing method and apparatus has found widespread commercial acceptance, there is room for further improvement. For example, with the "moisture meter" referred to above a meter was coupled to the two oscillators so as to give a minimum or "null" reading upon reaching a balanced condition. An indicator and a calibrated dial or scale was associated with the variable capacitor. Thus, a reading of the dial setting necessary to "null" the meter was noted, and a corresponding moisture content taken from a printed chart. A plurality of such charts were provided, one for each of a plurality of different grain products which might be tested. However, in the absence of a suitable chart, or in the case of a moisture content not within the range of adjustment of the variable capacitor, the unit would be incapable of obtaining the desired results.

Moreover, obtaining a reasonably accurate moisture determination, that is, within plus or minus one percent or better, requires a high degree of resolution in the dial or scale associated with the variable capacitor. In this regard, such resolution may be required down to the order of tenths of picofarads. The foregoing problems may be approached by the provision of a larger variable capacitor, however, such capacitors are not inherently linear. Moreover, with a larger capacitor, the exact null point or point of balance between the oscillators becomes increasingly less well defined, and hence proper observation of the meter becomes difficult. Also, the problem of mechanical variance or play in the indicator shaft, etc. intermediate the variable capacitor itself and the dial or scale may be a source of error. Moreover, resolution of the machine to a high degree of accuracy involved the provision of very fine dial divisions, often requiring the use of a magnifying glass to read and thus inviting further error.

Additionally, such accuracy requires a relatively stable and reliable circuit. In the foregoing prior art device a vacuum tube circuit was utilized in conjunction with a highly stable RC reference or calibration network for calibrating the instrument. While it is theoretically possible to replace vacuum tubes with solid-state devices such as FET's the substitution cannot be made without further circuit modifications. For example, while vacuum tube oscillators are reasonable linear with low harmonic distortion, solid-state or FET-based oscillators are generally noticeably more non-linear with significant harmonic distortion. In other respects, the output voltages developed in the pickup links in the vacuum-tube based oscillator circuits are effected by the transconductance of the tubes. This is of course eliminated with the substitution of solid-state devices.

Additionally, as previously noted, under certain conditions, for example, where moisture content and hence capacitance is relatively large, the "null" reading on the meter of the foregoing prior art device is not particularly well defined. Hence, some error may be introduced by inability of the operator to accurately determine by observation of the meter the exact point of balance between the oscillators.

As an additional matter, the mechanical aspects of the prior art device included a first tubular receptacle into which a premeasured quantity of the grain to be tested is introduced. This receptacle was then placed coaxially over the like-dimension tubular test cell and a pair of doors therein manually released to release the premeasured sample to the test cell. In order to minimize the handling of the sample of material and further insure accuracy, it is desirable to automate the foregoing procedure to some extent. In this regard, the prior art meter also required reference to temperature charts and separate measurement of the temperature of a sample to provide a correction factor for the moisture reading. In this regard, the first or "dial-reading" charts were established for a predetermined standard temperature, and hence variations in the actual temperature of the grain required reference to yet a further temperature correction chart. It is also desirable to automate this procedure.

Accordingly, it is a general object of the invention to provide a novel and improved moisture tester which substantially avoids the problems of the prior art devices, while maintaining the advantageous features thereof.

A more specific object is to provide a moisture tester of the foregoing type which provides a higher degree of resolution over a broader range of measurements than heretofore obtainable, while maintaining a surprisingly high degree of accuracy.

A related object is to provide such a moisture tester which provides a direct readout of moisture content of a sample under test without the necessity of referring to charts, conversion tables, or the like.

A related object is to provide an instrument in accordance with the foregoing object which provides such a direct readout, further taking into account both the type of material under test and the temperature thereof.

A further object is to provide an instrument in accordance with the foregoing objects wherein calibration of the instrument for the material under test and determination of the temperature of the sample are automatically accomplished.

A related object is to provide a test instrument in accordance with the foregoing objects which is surprisingly simple and inexpensive in its manufacture and design and yet highly reliable in operation.

The foregoing, as well as other objects, features and advantages of the invention will be more readily appreciated upon reading the following detailed description of the illustrated embodiment, together with reference to the accompanying drawings, wherein:

FIG. 1 is a perspective view of a moisture tester in accordance with the invention;

FIG. 2 is an enlarged side elevation, partially in section and partially broken away, of the moisture tester of FIG. 1;

FIG. 3 is a partial front elevation, partially in section and partially broken away, illustrating further features of the moisture tester of the invention;

FIG. 4 is a top plan view, partially in section and partially broken away, of the moisture tester of the invention;

FIG. 5 is a partial side elevation, partially in section and partially broken away, showing further details of the moisture tester;

FIG. 6 is a perspective view illustrating further details of a portion of the moisture tester of the previous figures;

FIG. 7 is a schematic circuit diagram of first or oscillator circuit of the invention;

FIG. 8 is a schematic circuit diagram of a second or temperature circuit of the invention; and

FIGS. 9A and 9B taken together form a schematic circuit diagram of a further or control circuit of the invention.

Referring now to the drawings and initially to FIGS. 1-6, various novel features of the mechanical apparatus and the method in accordance with the invention will be described with reference to a moisture tester or "unit" in accordance with the invention, designated generally by the reference numeral 10.

Initially, it will be seen that the moisture tester or unit 10 comprises a base or housing portion designated generally 12 which bears a suitable display 14 and controls 15, 16, 17, 18, and 19 on its face. A generally conventional test cell 20 includes a cylindrical outer wall or electrode 22 and a coaxially mounted inner or center electrode 24. In accordance with conventional practice, this test cell 20 operates essentially as a capacitor, whereby the capacitance or dielectric properties of a material to be tested may be determined by placing the material within the test cell 20. To this end, the test cell 20 further has an open top end 26 and a closed bottom end 28. The test cell 20 is both physically and electrically coupled with the base or housing 12, preferably by removable means, as indicated generally at 29. Accordingly, upon completion of testing of a given sample of material, the test cell 20 may be physically removed from the housing to dispose of the sample of material and ready the test cell for a further sample of material to be tested therein.

To this end, a dump cell designated generally by the reference numeral 30 is provided. Preferably, in accordance with the testing method of the invention, this dump cell 30 is initially filled with a premeasured sample of material. In this regard, it is preferred that a predetermined, accurately weighed sample of material be provided for testing in each instance, to assure uniformity and repeatability of moisture measurements from sample to sample.

Accordingly, a premeasured, predetermined weight of sample material is introduced into an open upper end 32 of the dump cell 30. Preferably dump cell 30 is an open-ended, tubular, cylindrical body of substantially similar diameter to the diameter of the test cell outer wall or electrode 22 and is constructed of a transparent plastic material. This latter outer wall 22 is preferably flared somewhat at its upper end as indicated at reference numeral 31 to receive the lower end of the dump cell 30 to assure transfer of the material therebetween.

Additionally, the dump cell 30 is provided with a pair of pivotally mounted, generally semi-circular door members 34, 36 in its lower interior portion. These doors will be seen to be pivotally or hingedly mounted at their central portions with respect to the tubular cell 30 by a suitable hinge pin, shaft or rod 38. Suitable hinge knuckles or sleeves 34a, 36a are provided in the respective door members 34 and 36 for receiving this hinge pin or rod 38.

Normally the doors 34 and 36 are held in a closed condition by a pair of stops or pins 42, 46 which extend through suitable openings provided therefor in a sidewall of the dump cell 30. These pins 42 and 46 are in turn coupled by a suitable yoke 48 to be controlled by an electrically operated solenoid 50. This solenoid 50 is carried in a suitable housing 52 which is coupled to the side of the dump cell 30. In accordance with a further preferred feature of the invention, a suitable temperature sensor or probe 54 is also mounted in the housing 52 so as to extend into the material received above the doors 34 and 36 in the dump cell 30. In this regard, preferably the temperature of the sample of material weighed and placed in the dump cell 30 is measured therein prior to the opening of the doors 34 and 36 to introduce the material into the test cell 20. As will be seen later, an automated sequence of operations is controlled by the circuits of FIGS. 9A and 9B, which accomplishes temperature measurement and door release in the proper sequence.

In accordance with a further feature of the invention, the housing 52 and hence dump cell 30 coupled thereto are pivotally mounted to a suitable vertically extending support member 56 which is in turn rigidly mounted to an upper surface 12a of the housing 12. This support 56 is provided with a suitable and preferably circular bearing surface 58 for pivotally or rotatably receiving therethrough a shaft member 60 which is coupled to one side of the housing 52. The shaft 60 is preferably generally cylindrical and includes suitable flanges 61, 63. The flange 61 preferably engages or abuts the surface 58 to hold the shaft assembled therewith. Accordingly, the dump cell is preferably manually rotated on shaft 60 about the bearing 58 following release of the doors 34, 36, to allow the doors to again return to their closed position by gravity. This rotation is of course less than 360 degrees and preferably on the order of 120 degrees in angular extent. Suitable sensors 62, 64 which may be, for example, leaf-type miro-switch elements, sense the two extremes of rotation of the dump cell 30 and housing 52. It is noted that the temperature sensor 54 has not been illustrated in FIG. 4 in order to more clearly show the solenoid 50, pins 42, 46 and related structure. Responsive control circuits to be described later, cause the solenoid 50 to withdraw and reinsert the pins 42, 46 so as to control the doors 34 and 36 in conjunction with this manual rotation of dump cell 30. The doors are thus normally held in the closed position for receiving and holding a sample of material in the dump cell 30, until it is time to introduce the sample into the test cell 20. This automated sequence of operation will be further described later with reference to the control circuitry of the invention.

In accordance with a further feature of the invention, electrical signals are fed to and from the solenoid 50 and temperature sensor 54 by a novel, non-stressed or "stress free" cable mounting arrangement. In this regard, a flat or ribbon-type multiple conductor cable 70 is provided from the control circuits mounted within housing 12 and extends into support member 56. This cable 70 is fed through an axially extending slot 72 through the shaft 60 which is a substantially tubular or hollow and preferably cylindrical body. The cable 70 is thereupon fed axially through the interior of the shaft 60 to the solenoid 50 and temperature sensor or probe 54. Preferably, a quantity of suitable packing material 74 is provided about the portion of cable 70 within the shaft 60 to prevent relative frictional engagement therebetween as might otherwise occur upon rotation of the shaft 60. Advantageously, the portion of the cable 70 extending outwardly of the slot 72 is then wrapped substantially one and one-half times circumferentially about the shaft 60 as best seen in FIG. 2. In operation, then, the wrapped portion of the cable 70 acts substantially like a clock spring, tightening somewhat as the dump cell 30 and housing 52 are rotated backwardly as viewed in FIG. 2 about the support member 56 and unraveling somewhat in response to opposite rotation for delivering the dump cell 30 to the rest position at the top of test cell 20. Accordingly, it will be seen that substantially no stress is experienced in the cable 70 itself during this rotation.

As will be more fully described later with reference to the control circuits of the invention, the housing also includes a suitable aperture 80 for receiving one of a plurality of plug-in modules such as a module 82. Briefly, these modules permit the unit 10 to be utilized for obtaining moisture readings in any of a plurality of different materials, without the need for extensive recalibration procedures or any other modification thereto. In this regard the plug-in module 82 contains a suitable solid-state memory component which carries necessary calibration and other data or information for enabling the moisture tester of the invention to measure the moisture content of a given material. It is contemplated that one such plug-in module 82 may be provided for each material to be tested.

Referring now also to FIG. 6 and in accordance with a further feature of the invention, a novel stepping control or drive arrangement for controlling the position of a variable capacitor is designated generally by the reference numeral 90. In this regard, a variable capacitor 92 is generally of the variety having a first plurality of fixed plates 94 and a second plurality of relatively movable plates 96 which are preferably rotatable about 360 degrees for intermeshing engagement with respect to the fixed plates 94. To this end, a suitable drive shaft 98 couples the rotatable or relatively movable plates 96 to a gear train comprising a sprocket-type gear 100 driven by a worm-type gear 102. In the illustrated embodiment, the gear ratio provided is 50 to 1.

In accordance with a feature of the invention, a stepper or stepping motor 104 is provided for rotating the worm gear 102 by way of a suitable shaft 106. Preferably the motor 104 is a model 82201-P2 "stepper motor" available, for example, form AirPax, Cheshire division, Cheshire, CT 06410. As is known in the art, such a stepping motor may be conventionally driven to provide substantially 71/2 degree steps, so as to achieve 48 steps per 360 degree revolution thereof. However, the motor 104 is preferably controlled by the circuits of FIGS. 9A and 9B to be described later, so as to achieve "half steps" of substantially 33/4 degrees each, thereby achieving 96 steps about the 360 degrees of revolution thereof. Accordingly, with the 50 to 1 ratio provided by the gears 100, 102, it will be seen that the variable capacitor 92 in accordance with the present invention has 4800 definable steps or positions about 360 degrees of rotation of plates 96 with respect to plates 94. It will be appreciated that the foregoing arrangement provides a heretofore unobtainable degree of resolution in measuring the position, and by extension, the capacitance value at any given position or setting of the capacitor 92.

The operation of the foregoing will be more readily understood with reference to the operation of certain circuits as will next be described with reference to FIG. 7.

In FIG. 7, an oscillator or test cell circuit in accordance with the invention is designated generally by the reference numeral 110. This circuit 110 includes a reference oscillator circuit designated generally 112 and a test cell oscillator circuit designated generally 114.

In accordance with the prior art method, the reference oscillator 112 and test cell oscillator 114 are inductively coupled in a common inductive loop, whereby some amount of energy is extracted from each oscillator and used to operate a null detection circuit (to be discussed later), which may operate in the fashion of a milliammeter ("meter"). Essentially, the capacitance of test cell 20 is placed in the tank circuit of the test cell oscillator 114, in parallel with the variable capacitor 92. Thereupon, with the test cell 20 empty, the variable capacitor 92 may be adjusted until the two oscillator circuits 112 and 114 are in a balanced condition. It is well known that in such balanced condition the minimum amount of current, will flow in the common loop therebetween resulting in a minimum "meter" reading, or "null". The prior art apparatus in fact employed an ammeter to indicate this balanced or "null" condition. Accordingly, the test cell 20 may then be filled with the sample of material, whereupon the variable capacitor 92 is again adjusted to obtain a second null or minimum "meter" reading in the same fashion. Since the two capacitances (test cell 20 and variable capacitor 92) are in parallel, it will be recognized that the amount of capacitance removed from the circuit by re-adjusting the variable capacitor 92 is equal to the capacitance added to the circuit by the introduction of the sample into the test cell 20.

In the prior art apparatus, suitable charts or tables were provided for each material, whereby the operator could convert a reading from a graduated dial associated with a variable capacitor similar to capacitor 92 to a moisture content reading for the material being tested. Hence, not only may the relative position of the variable capacitor be readily equated with the capacitance thereof, but importantly, the change in position is indicative of the change in capacitance which occurs upon re-adjustment of the capacitor to cancel out the capacitance added by the introduction of the sample.

Accordingly, it was important in the prior art apparatus to accurately center or "zero" the capacitor with respect to its associated dial between readings. In this regard, it was equally important that the empty cell or calibration reading always be taken at exactly the same dial reading and hence capacitor position. Accordingly, the prior art arrangement provided an additional trimmer capacitor and a calibration procedure for this purpose. Moreover, the charts were based upon readings taken at a given reference temperature, whereby the temperature of the sample had to be separately measured and additional temperature correction tables referred to as well. As previously mentioned, the prior art device also utilized vacuum tube circuits for the reference and test cell oscillators and a microammeter for determining the null point at which the reading from the variable capacitor dial was to be recorded.

It will be appreciated from the foregoing description of the prior art that the meter, the dial markings and finally selecting and reading the charts in all instances presented problems in obtaining accurate measurements. Moreover, with increasing percents moisture and increasing capacitance, the sharpness or width of the null point is known to increase somewhat, such that an operator might experience some difficulty in determining the exact "null" point from observing the meter alone. Additionally, the degree of resolution obtainable by a manually adjusted dial and associated indicia was limited.

Advantageously, and referring again to FIG. 7, the present invention solves many of the foregoing problems of the prior art device. Initially, it will be seen that the reference oscillator circuit 112 and test cell oscillator circuit 114 comprise solid-state circuits. In this regard, both oscillators use FET components 116, 118, each of which preferably comprises an RCA type 40819 dual-gate MOSFET. The reference oscillator is provided with a crystal element 120 to further enhance and promote stability of the reference frequency signal provided thereby. Both oscillator circuits 112 and 114 further advantageously include automatic gain control (AGC) circuits 122 and 124, each of which comprises a pickup coil 126, a peak detector comprising transistor 128 and related components and an error amplifier 130. (The like components with respect to the circuit 122 are designated by like reference numerals with subscript a.) Preferably the error amplifiers 130 each comprise 1/2 of a dual operational amplifier of the type generally designated TL072, low-noise JFET input OP AMP.

The output of each error amplifier 130 modulates the transconductance of its associated FET 116, 118 by varying the voltage at the gate 2 (G2) electrode thereof. Also coupled at the respective gate electrodes (G1 and G2) of respective FET's 116 and 118 are additional coils 132, 134, (132a, 134a). These coils together with the previously mentioned pickup coils 126 (126a) are realized in the form of a pair of similar inductor elements, wound on respective common cores. Accordingly, each of these elements comprises a generally variably coupled inductance between respective windings 132, 134 on the one hand, and pickups 126 on the other hand and preferably a movable core piece 136 (136a) is provided to fine tune or otherwise adjust these respective inductors. Additionally, the coils 132 and 132a are coupled by way of suitable RC networks to a positive supply. Suitable RF shielding is also provided for the foregoing components as indicated by the dashed lines surrounding the circuits 112 and 114.

Coupling between the two oscillator circuits is defined by a diode 140 and series-coupled resistor 142 extending between pickup coil 126a and pickup coil 126. Hence the output or "null" voltage is developed across an output or load resistor 144. While such FET oscillators are known to present higher harmonic distortion than the vacuum tube-type oscillators which they replace, as mentioned above, this can also be minimized by constraining the drain-to-source voltage swings thereof. This is done by provision of the AGC loops as described above.

Moreover, it is believed that the provision of such AGC loops further allows substitution of a new FET, if necessary for either of the FET's 116 and 118 without experiencing problems stemming from different characteristics from one component to another. In contrast, the vacuum tube oscillators referred to above suffer in that their output voltages in the pickup links are affected by the transconductance of the tubes, whereby replacing one of the tubes may throw the circuit seriously out of balance such that a good null is no longer obtainable. Accordingly, the above-described FET-based oscillator circuit is advantageous in this regard as well.

Preferably, the peak-to-peak voltage at pickup coil 126a is at all times held by the illustrated circuits somewhat higher than the peak-to-peak (p-p) voltage at the pickup coil 126. In the illustrated embodiment, the voltages maintained at these elements are on the order of 3.4 V p-p and 3.0 V p-p respectively. This difference assures that the reference oscillator runs at a slightly higher amplitude at all times, in turn assuring that the "null" voltage developed across output resistor 144 is slightly positive at all times. Advantageously, this permits this voltage to be fed to a ground-referenced analog-to-digital (A/D) converter, as will presently be seen. In this regard, output resistor 144 is coupled by way of a suitable inductor 146 to the non-inverting input of a first operational amplifier (op amp) 148 (e.g., TL071). This first op amp 148 feeds a second amplifier stage 150 (e.g., LF398) whose output feeds the previously-mentioned A/D converter by way of an output line 152. Additionally, a DC blocking capacitor 154 provided in the base circuit of the transistor 128 serves to block the DC component of the null voltage at the base electrode of the transistor 128.

Referring to the lower left hand portion of FIG. 7, relays K1 and K2 and the associated like-designated coils respond to control signals at like designated inputs from a control circuit to be described later. These relays switch into circuit a pair of reference standardization networks 156 and 158. Preferably, one of these networks presents a relatively high capacitance and the other a relatively low capacitance, so as to perform an automatic self-check procedure each time the instrument is utilized. That is, as will presently be described, the known values of these reference networks are stored in a memory unit, whereby readings taken thereof may be compared with the known, stored value to assure proper functioning of the unit. An additional relay K3 shorts the gate 1 (G1) electrode of FET 118 to ground to protect the FET against damage from electrostatic discharge. This last relay K3 is preferably automatically held in closed condition when the unit is not in use to provide such protection. The K3 input also feeds a control point 155 at the emitter electrode of trannsistor 128.

Referring briefly to FIG. 8, the temperature sensor or sensing element 54 previously described with reference to FIGS. 1-4 and a related circuit are illustrated in circuit schematic form. Preferably sensor 54 comprises a temperature variable element of the type generally designated A0537KH. The pin numbers indicated in the circuit diagram of FIG. 8 correspond to the standard pin numbers of this component. The output signal of the temperature sensor 54 corresponding to the temperature sensed thereby is delivered to the control circuit of FIGS. 9A and 9B by way of an output terminal 160. Additionally, a solenoid activated signal (SOL.ACT.) feeds into the circuit at an input 162 while a dump cell signal (DUMP) feeds the circuit at an input 164. These signals relate to the automated operation of the test apparatus or unit of the invention as will next be described with reference to FIGS. 9A and 9B. A suitable regulated power supply 166 is also provided. Preferably, the foregoing circuit is mounted to a suitable printed circuit card (not shown here or in FIGS. 1-5) mounted in housing 52. Hence, the D.C. voltage and control lines 162 and 164 may be fed out to the solenoid 50 from this circuit board.

Referring now to FIGS. 9A and 9B, in accordance with a preferred form of the invention, a digital computer or microprocessor-based control circuit is utilized to perform the sequence of temperature measurement and delivery of the sample from the dump cell 30 to the test cell 20 as described above with reference to FIGS. 1-5. Moreover, this control circuit also controls operation of the stepping motor of FIG. 6, as previously described, so as to obtain "half" steps thereof, and to thereby obtain 4800 steps per 360 degrees revolution of the variable capacitor 92 as previously mentioned.

Advantageously, the use of the digital computer circuit of FIGS. 9A and 9B greatly facilitates operation of the aforementioned stepping motor to resolve the position of the variable capacitor with great accuracy. That is, the 4800 steps or positions per revolution, as previously mentioned, are readily counted during rotation of the motor, whereby the position of the capacitor at any time can be determined.

In this regard, a microprocessor 200 (FIG. 9A) is preferably of the type generally designated 8085AH, for example, as manufactured by intel. The various pins and their functional designations of the microprocessor are here designated in standard form and include an 8-bit data bus designated generally AD0-AD7. A 4-megahertz crystal 201 is provided at suitable crystal input terminals X1, X2 in conventional fashion. The previously mentioned plug-in module 82 preferably includes a solid-state memory component of the type generally designated 2732, which is a 4K by 8 EEPROM. The respective leads from this module are arranged to interconnect with terminals 202 at the lower right-hand side of FIG. 9A.

Additional "on-board" memory for the processor 200 is provided in a pair of memories 204, 206. In the illustrated embodiment, memory 204 comprises a 2K by 8 EEPROM of the type generally designated 2817, although a 2816 type may also be utilized. The memory 206 preferably comprises an ultraviolet erasable PROM (UVEPROM) of the type generally designated 2764 (8K by 8), however, a similar 27128, (16K by 8) unit may also be utilized. A suitable latch, preferably of the type designated 8212 as indicated at 208 interconnects a number of address lines of plug-in module-receiving terminals 202 as well as for memories 204 and 206 to be addressed from the microprocessor 200. Additional such memory address lines are coupled directly to corresponding lines of the processor as indicated by reference characters. Chip selection, that is, for selecting one of the memories 204 or 206, or the memory included in plug-in module 82 is provided in the form of a 1 of 8 decoder/demultiplexer 210 which in the illustrated embodiment may comprise a component of the type generally designated 74LS138. A second similar decoder demultiplexer 212 is provided for selecting one of the components of FIG. 9B the display 14, or the controls 16-19 (see FIG. 1) for input/output with the processor 200.

Referring now to FIG. 9B, the previously mentioned analog-to-digital conversion of the output signal of the circuit of FIG. 7 (on line 152 thereof) is accomplished by A to D converter 220 (A/D). In this regard, it will be remembered that the converter is ground referenced, whereby the line 152 feeds the like-referenced line of FIG. 9B and the negative voltage input line of the A/D converter 220 is tied to circuit ground. An additional peripheral comprises an input/output component 222 which in the illustrated embodiment preferably comprises a timer/RAM/I/O component of the type generally designated 8155 and as here designated in simplified form as "I/O".

The temperature output line 160 of the temperature circuit of FIG. 8 feeds the like designated line 160 (TEMP) of the I/O 222. Additional input/output lines are indicated in functional terminology in FIG. 9B. These include lines for controlling data transfer from plug-in module 82 as well as a HOLD control line from the circuit of FIG. 7. The solenoid activated (SOL.ACT.) line mentioned above with reference to the temperature circuit of FIG. 8 as well as suitable inputs from the dump cell position sensor switches 62, 64 (DUMP UP and DUMP DN) previously mentioned are also input to the I/O 222 with suitable intervening input circuitry. Outputs from the I/O 222 are fed through a suitable high current driver component 224 and include a control signal (DUMP) to release the doors of the dump cell to introduce the sample into the sample cell as previously described.

Additional outputs include lines designated K1, K2 and K3 for energizing the like-designated solenoids or relays of the circuit of FIG. 7. The remaining outputs designated generally by reference numeral 226 are coupled in predetermined fashion to the stepper or stepping motor 104 to achieve half-stepping thereof by intermittently energizing the four poles thereof in predetermined sequence as previously mentioned. This sequence is controlled by the processor 200 in accordance with suitable programmed instructions carried in memory 204 and/or 206. Additional inputs and outputs designated generally 228 are coupled to the control elements 16-19 and to the display 14 described above with reference to FIG. 3. These latter display driver outputs 228 preferably are fed out of the I/O 222 by way of a suitable bi-directional buss driver 230, which in the illustrated embodiment comprises an integrated circuit component of the type generally designated 74LS245. Preferably, the display 14 comprises a liquid crystal display (LCD), and is provided with suitable decoder and driver circuitry (not shown).

In operation, the microprocessor 200 and associated memory components 204 and/or 206 are programmed to carry out a predetermined sequence of automated operation with respect to the test apparatus shown and described earlier in FIGS. 1-6. Initially, upon powering up the unit, the digital computer performs an "orienting" operation, driving the stepping motor to locate a readily-refindable base or reference point with respect to the position of variable capacitor 92. In this regard, it has been found that with the test cell 20 empty, the null points, that is the positions of the variable capacitor at which the oscillator circuits of FIG. 7 balance, are substantially equidistant from the point at which respective movable plates 96 and fixed plates 94 are substantially in a "fully meshed" condition. Accordingly, this "fully meshed" position may be utilized as a base, reference or "step 1" point in determining the other positions of the stepping motor and gear drive assembly, which will be remembered to be 4800 possible incremental positions about 360 degrees of rotation thereof.

A surprisingly high degree of resolution of capacitor position and hence value, and by extension, of moisture contents of materials being measured is obtainable by the invention. That is, the processor 200 is capable, in view of the A to D conversion provided by A/D circuit 220 of counting and registering the steps of rotation of motor 104, and hence determining the relative position of the variable capacitor 92 at all times, based upon this "step 1" or "fully meshed" reference or base position. In practice, this base position may be recomputed initially upon powering up of the unit to confirm the proper functioning thereof, by comparison with data regarding the base position stored in memory.

Accordingly, this base or "fully meshed" position may be utilized so that the processor in effect counts the incremental steps occurring between this base position and any other relative setting or position of variable capacitor 92, so as to obtain a highly accurate and repeatable reading of relative positions thereof and therefore of the change in capacitance values. It will be remembered that it is the change in the capacitance value between that obtained with the empty test cell and that obtained with the test cell filled with sample that is indicative of the capacitance value and hence moisture content of the sample.

In conjunction with each test initiated, the relays K1 and K2 are also selectively energized in the proper sequence to obtain readings of the values of the associated standardized capacitance networks. These readings are then also compared with readings previously stored in the memory circuits of FIG. 9A to reconfirm proper operation of the unit and its circuits. In practice, a single 360 degree revolution of the stepping motor 104 may be utilized, under control of the processor 200 with proper switching, in sequence, of the standardizing networks and reading of empty test cell null points. Accordingly, a single revolution is controlled in proper sequence to achieve this initial setting up, calibration or verification of proper operation of the unit and circuits of the invention, all in an automated fashion.

It will be recognized in this regard that each measurement, that is, of the empty test cell, of the relatively high standardized network and of the relatively low capacitance standardized network will be again capable of testing and confirmation at a "mirror image" point defined by the relative intermeshing of the plates of variable capacitor 92. Accordingly, each reading is in effect taken twice per 360 degrees revolution of movable or rotatable plates 92, and this may also be utilized to reconfirm the proper operation of the unit and circuits of the invention.

At the same time, the foregoing setup procedures are automatically taking place, the temperature of a sample of material pre-weighed and introduced to dump cell 30 as previously described is measured by temperature sensor 54. This information is also fed to the processor 200 and held in memory for later use in automatically adding any necessary temperature corrections to the moisture measurement.

Upon completion of the foregoing operations, the solenoid 50 is automatically actuated to allow the doors 34, 36 to drop and introduce the sample of material into test cell 20. Thereupon, the motor 104 is again actuated in the same fashion to rotate the movable plates of variable capacitor 92 through another 360 degrees, carefully noting the exact ones of the 4800 steps per revolution where the "null" point occurs. From this information, coupled with the information as to the particular material under test (that is, its characteristic capacitance versus moisture) as carried in the plug-in unit 82, the processor 200 can readily calculate the moisture content of the sample. Additionally, a temperature correction, as previously mentioned, is also utilized in arriving at moisture content.

Advantageously, the fact that exact linearity is not obtainable in a variable capacitor may be readily compensated for by the novel microprocessor components of the invention. Moreover, differences or variations from one unit to another may readily be compensated for. In this regard, the memory components 204 and/or 206 may readily be programmed with information obtained during factory testing and calibration of each unit so as to provide automatic corrections for any non-linearities or other variations obtained during operation of the unit. Briefly, this is done by substituting high-accuracy standardized capacitance components for the test cell 20, obtaining readings on the unit, and putting into memory any necessary correction factors in view of the variance of these readings from the known values of the test standards. This process is often referred to as "linearization" of the unit.

In order to provide a full description of one specific embodiment of the invention, the following pages contain a listing of an exemplary program for the microprocessor 200.

While the invention has been illustrated and described herein with reference to specific embodiments, the invention is not limited thereto. Those skilled in the art may devise various changes, alternatives and modifications. Such changes, alternatives and modifications are included in the invention insofar as they fall within the spirit and scope of the appended claims. ##SPC1## ##SPC2## ##SPC3## ##SPC4## ##SPC5## ##SPC6##