Reactors with isolated gas connectors and methods for depositing materials onto micro-device workpieces

[0001] The present invention is related to reactors with isolated gas connectors and methods for depositing materials in thin film deposition processes used in the manufacturing of micro-devices.

[0002] Thin film deposition techniques are widely used in the manufacturing of micro-devices to form a coating on a workpiece that closely conforms to the surface topography. The size of the individual components in the devices is constantly decreasing, and the number of layers in the devices is increasing. As a result, the density of components and the aspect ratios of depressions (e.g., the ratio of the depth to the size of the opening) are increasing. The size of workpieces is also increasing to provide more real estate for forming more dies on a single workpiece. Many fabricators, for example, are transitioning from 200 mm to 300 mm workpieces, and even larger workpieces will likely be used in the future. Thin film deposition techniques accordingly strive to produce highly uniform conformal layers that cover the sidewalls, bottoms, and corners in deep depressions that have very small openings.

[0003] One widely used thin film deposition technique is Chemical Vapor Deposition (CVD). In a CVD system, one or more precursors that are capable of reacting to form a solid thin film are mixed in a gas or vapor state, and then the precursor mixture is presented to the surface of the workpiece. The surface of the workpiece catalyzes the reaction between the precursors to form a thin solid film at the workpiece surface. A common way to catalyze the reaction at the surface of the workpiece is to heat the workpiece to a temperature that causes the reaction.

[0004] Although CVD techniques are useful in many applications, they also have several drawbacks. For example, if the precursors are not highly reactive, then it is often necessary to heat the workpiece to a temperature that catalyzes the reaction between the precursors. Heating the workpiece, however, can be detrimental to the structures and other materials already formed on the workpiece. Implanted or doped materials, for example, can migrate within the silicon substrate at higher temperatures. On the other hand, if more reactive precursors are used so that the workpiece temperature can be lower, then reactions may occur prematurely in the gas phase before reaching the substrate. This is undesirable because the film quality and uniformity may suffer, and also because it limits the types of precursors that can be used.

[0005] One conventional system to prevent premature reactions injects the precursors into the reaction chamber through separate ports. For example, each port of a showerhead can be coupled to a dedicated gas line for a single gas. Systems that present the precursors through dedicated ports proximate to the surface of the workpiece, however, may not sufficiently mix the precursors. Accordingly, the precursors may not react properly to form a uniform, thin solid film on the workpiece surface. Furthermore, conventional systems also have a jetting effect that produces a higher deposition rate directly below the ports. Thus, conventional CVD systems may not be appropriate for many thin film deposition applications.

[0006] Atomic Layer Deposition (ALD) is another thin film deposition technique. FIGS. 1A and 1B schematically illustrate the basic operation of ALD processes. Referring to FIG. 1A, a layer of gas molecules A_x coats the surface of a workpiece W. The layer of A_x molecules is formed by exposing the workpiece W to a precursor gas containing A_x molecules, and then purging the chamber with a purge gas to remove excess A_x molecules. This process can form a monolayer of A_x molecules on the surface of the workpiece W because the A_x molecules at the surface are held in place during the purge cycle by physical adsorption forces at moderate temperatures or chemisorption forces at higher temperatures. The layer of A_x molecules is then exposed to another precursor gas containing B_y molecules. The A_x molecules react with the B_y molecules to form an extremely thin layer of solid material on the workpiece W. The chamber is then purged again with a purge gas to remove excess B_y molecules.

[0007] FIG. 2 illustrates the stages of one cycle for forming a thin solid layer using ALD techniques. A typical cycle includes (a) exposing the workpiece to the first precursor A_x, (b) purging excess A_x molecules, (c) exposing the workpiece to the second precursor B_y, and then (d) purging excess B_y molecules. In actual processing, several cycles are repeated to build a thin film on a workpiece having the desired thickness. For example, each cycle may form a layer having a thickness of approximately 0.5-1.0 , and thus it takes approximately 60-120 cycles to form a solid layer having a thickness of approximately 60 .

[0008] FIG. 3 schematically illustrates an ALD reactor 10 having a reaction chamber 20 coupled to a gas supply 30 and a vacuum 40. The reactor 10 also includes a lid 80 coupled to the reaction chamber 20, a heater 50 that supports the workpiece W, and a gas distributor 60 in the reaction chamber 20. The gas distributor 60 includes a plenum 62 operatively coupled to the gas supply 30 and a distributor plate 70 having a plurality of holes 72. In operation, the heater 50 heats the workpiece W to a desired temperature, and the gas supply 30 selectively injects the first precursor A_x, the purge gas, and the second precursor B_y as shown above in FIG. 2. The vacuum 40 maintains a negative pressure in the chamber to draw the gases from the gas distributor 60 across the workpiece W and then through an outlet of the reaction chamber 20.

[0009] One drawback of ALD and CVD processing is that it is difficult to control the uniformity of the deposited films over a long period of time. For example, the individual precursors and/or the resulting material that is formed by the reaction between the precursor gases may build up on the components of the reaction chamber 20. Additionally, when the adsorption of the first precursor and/or the second precursor reaches a saturation point, the precursors will then begin to desorp into the gas flows. Such adsorption and desorption of the precursors continually changes the concentration of the first and second precursors in the chamber, which often adversely affects the quality of the film deposited onto the workpieces. As a result, the ALD and CVD reactors may need to be taken off-line for cleaning, which is time-consuming and reduces the throughput of a fabrication process. Therefore, there is a need to provide better control of the adsorption and desorption rates to achieve more consistent results throughout a run of workpieces and reduce downtime of ALD and CVD reactors.

[0010] The present invention is directed toward reactors for depositing materials onto micro-device workpieces, systems that include such reactors, and methods for depositing material onto micro-device workpieces. In one embodiment, a reactor for depositing materials onto a micro-device workpiece includes a reaction chamber, a passageway, and a door assembly. The reaction chamber includes a gas distributor configured to provide a flow of gas(es) to a micro-device workpiece on a workpiece holder. The passageway has a first end open to the reaction chamber and a second end apart from the reaction chamber. The passageway is configured to provide ingression to and egression from the chamber for a micro-device workpiece being handled by a robotic system. The door assembly is configured to sealably close a door at the second end of the passageway. The reactor further includes a gas conditioning system positioned at least proximate to the door; the gas conditioning system maintains a desired concentration and phase of gas constituents in the passageway to inhibit adsorption and/or desorption of the precursors in the second end of the passageway.

[0011] The gas conditioning system can have various embodiments. In one embodiment, a plurality of flow ports are positioned in the door and a secondary gas is flowed through the flow ports into the passageway. The secondary gas, for example, can be a purge gas. The flow of the secondary gas through the passageway inhibits undesirable adsorption or desorption of precursor gas(es) within the passageway area. In another aspect, the flow ports can be configured to flow the secondary gas along a particular vector or create a vortex within the passageway. In another embodiment, the gas conditioning system can include a heating element in the door to control the temperature of the second end of the passageway area.. The heating element maintains the second end of the passageway at a desired temperature. The heating element can be any device that heats the passageway area, such as an electrical radiator, a liquid radiator, a Peltier cell, or a superheated inert gas.

[0012] In yet another embodiment, the gas conditioning system can include a plurality of flow ports proximate to the second end of the passageway. The flow ports are open to the passageway to provide a flow of a secondary gas through the passageway. In still another embodiment, the gas conditioning system can include a heating element located proximate to the second end of the passageway. Additional embodiments of the gas conditioning system can include using both a plurality of flow ports and a heating element in the door assembly and/or proximate to the second end of the passageway. In still another embodiment, only a single flow port for the secondary gas may be positioned in the door and/or the second end of the passageway.

[0013] The apparatus can be used to perform several CVD, ALD, or other methods for depositing materials onto a micro-device workpiece. In one embodiment, a method for inhibiting an undesirable concentration and/or phase of gas constituents from being in the passageway includes flowing a secondary gas through the passageway area. In a further aspect of this embodiment, the method can include heating the second end of the passageway to a desired temperature in addition to or in lieu of flowing a secondary gas through the passageway. Additional embodiments of this method include flowing a heated secondary gas through the passageway.

[0014] FIGS. 1A and 1B are schematic cross-sectional views of stages in ALD processing in accordance with the prior art.

[0015] FIG. 2 is a graph illustrating a cycle for forming a layer using ALD techniques in accordance with the prior art.

[0016] FIG. 3 is a schematic representation of a system including a reactor for depositing a material onto a micro-device workpiece in accordance with the prior art.

[0017] FIG. 4 is a schematic representation of a reactor system for depositing material onto a micro-device workpiece in accordance with one embodiment of the invention.

[0018] FIG. 5 is a cross-sectional view of a gas conditioning system used in a reactor system for depositing material onto a micro-device workpiece in accordance with one embodiment of the invention.

[0019] FIG. 6 is a cross-sectional view of a gas conditioning system used in a reactor system for depositing material onto a micro-device workpiece in accordance with another embodiment of the invention.

[0020] FIG. 7 is a cross-sectional view of a gas conditioning system used in a reactor system for depositing material onto a micro-device workpiece in accordance with another embodiment of the invention.

[0021] FIG. 8 is a cross-sectional view of a gas conditioning system used in a reactor system for depositing material onto a micro-device workpiece in accordance with another embodiment of the invention.

[0022] FIG. 9 is a cross-sectional view of a gas conditioning system used in a reactor system for depositing material onto a micro-device workpiece in accordance with another embodiment of the invention.

[0023] FIG. 10 is a cross-sectional view of a gas conditioning system used in a reactor system for depositing material onto a micro-device workpiece in accordance with another embodiment of the invention.

[0024] The following disclosure describes several embodiments of reactors for depositing material onto micro-device workpieces, systems including such reactors, and methods for depositing materials onto micro-device workpieces. Many specific details of the invention are described below with reference to depositing materials onto micro-device workpieces. The term micro-device workpiece is used throughout to include substrates upon which and/or in which microelectronic devices, micromechanical devices, data storage elements, read/write components, and other features are fabricated. For example, micro-device workpieces can be semiconductor wafers, such as silicon or gallium arsenide wafers, glass substrates, insulative substrates, and many other types of materials. The term gas is used throughout to include any form of matter that has no fixed shape and will conform in volume to the space available, which specifically includes vapors (i.e., a gas having a temperature less than the critical temperature so that it may be liquefied or solidified by compression at a constant temperature). Several embodiments in accordance with the invention are set forth in FIGS. 4-10 and the following text to provide a thorough understanding of particular embodiments of the invention. It is to be understood, however, that the invention may have additional embodiments, or that the invention may be practiced without several of the details of the embodiments shown in FIGS. 4-10.

[0025] FIG. 4 is a schematic representation of a system 100 for depositing material onto a micro-device workpiece W in accordance with one embodiment of the invention. The system 100 includes a reactor 110 having a reaction chamber 120 coupled to a gas supply 130 and a vacuum 140. The reactor 110 also includes a gas distributor 160 coupled to the gas supply 130 and a workpiece holder 150 that supports the workpiece W. The gas distributor 160 is positioned over the workpiece holder 150 to deliver gas(es) to the workpiece W. The workpiece holder 150 can be a heater or heat sink that holds the workpiece W at a desired temperature. In other embodiments, however, the workpiece holder 150 may not be heated. The reaction chamber 120 is coupled to the vacuum 140 to draw gases from the gas distributor 160 across the workpiece W and then out of the reaction chamber 120.

[0026] The system 100 further includes an access chamber 169 that includes a passageway 170 configured to provide ingression to and egression from the reaction chamber 120 for the workpiece W. The passageway 170 includes a first end 171 open to the reaction chamber 120 and a second end 172 apart from the first end 171. When the second end 172 of the passageway 170 is open, a robotic device can pass a workpiece W through the passageway 170 and place the workpiece on the workpiece holder 150. After processing, the robotic device removes the workpiece W from the workpiece holder 150 and carries the workpiece back through the passageway 170.

[0027] The system 100 further includes a door assembly 175 located at the second end 172 of the passageway 170. The door assembly 175 includes a door 176 and an actuator assembly 180 to move the door 176 between a first position to open the passageway 172 and a second position to close the passageway 172. The actuator assembly 180 includes an actuator shaft 181, an actuator 182 that receives a portion of the actuator shaft 181, a first fluid inlet/outlet 183, and a second fluid inlet/outlet 184. The actuator assembly 180 can further include a bellows 185 that surrounds a portion of the shaft 181. One end of the shaft 181 carries the door 176, and the other end of the shaft 181 includes a piston head in the actuator 182. In operation, pressurized air is injected into the first fluid inlet/outlet 183 while exhaust air flows through the second inlet/outlet 184 to disengage the door 176 from the second end 172 of the passageway 170. Conversely, pressurized air is injected through the second fluid inlet/outlet 184 while exhaust air flows through the first inlet/outlet 183 to engage the door 176 with the second end 172 of the passageway 170. The door 176 seals the passageway 170 in the closed or second position for processing the workpiece W in the reaction chamber 120.

[0028] The system 100 further includes a gas conditioning system 190 at least proximate to the second end 172 of the passageway 170. The gas conditioning system 190 can be a component carried by the door 176 and/or the access chamber 169 at the second end 172 of the passageway 170. The gas conditioning system 190 is configured to maintain or control the desired concentration and/or phase of the reactive constituents within the passageway 170. As such, several embodiments of the gas conditioning system 190 are expected to mitigate or inhibit adsorption and/or desorption of constituent gases within the passageway that can reduce the quality of the film deposited on the workpiece W. Several embodiments of gas conditioning systems 190 are described in more detail below with reference to FIGS. 5-10.

[0029] FIG. 5 is a cross-sectional view of an embodiment of a gas conditioning system 190 in accordance with an embodiment of the invention. In this embodiment, the gas conditioning system 190 includes a secondary gas passage 202 in the door 176 and the actuator shaft 181. The gas conditioning system 190 also includes a plate 204 attached to the door 176. The plate 204 includes a plurality of flow ports 206. A seal 208 can extend around the plate 204 to seal the door 176 to the second end 172 of the passageway 170. In operation, the door 176 is sealed to the second end of the passageway, and then a secondary gas flows through the secondary gas passage 202 and the flow ports 206. The flow ports 206 can be configured to project the secondary gas flow along a vector parallel to the passageway 170. In other embodiments, the flow ports 206 can be configured to direct the flow of the secondary gas along a different vector at an angle to the passageway 170 or to create a vortex within the passageway 170.

[0030] The secondary gas flowing through the flow ports 206 can be a purge gas. For example, the purge gas can be the same gas that is used during the purge cycle for ALD or CVD processing. In other embodiments, the secondary gas can be a different type of purge gas. The secondary gas can flow continuously during a deposition cycle, or it can flow for only a portion of the deposition cycle. For example, in ALD processing, a secondary gas can flow only during the purge cycle in certain embodiments, or it can flow during the pulses of one or more precursor gases in addition to or in lieu of flowing during the purge cycle. In CVD processing, the secondary gas can flow periodically or continuously during a deposition cycle or between deposition cycles.

[0031] One advantage of the embodiment illustrated in FIG. 5 is that the flow of secondary gas in the passageway 170 inhibits adsorption and/or desorption of the precursor gases in the passageway 170. The present inventors have discovered that the precursors are particularly susceptible to adsorp to the access chamber because the passageway 170 can entrap some of the precursor molecules and it may not be at the same temperature as the reaction chamber 120. The flow of secondary gas is expected to scrub or remove precursors from the passageway before they can adsorp to the surface of the door 176 or the access chamber 169. The flow of secondary gas through the passageway 170, therefore, should provide better control of the concentration and phase of precursors in the reaction chamber that will result in higher quality films.

[0032] FIG. 6 is a cross-sectional view illustrating another embodiment of the gas conditioning system 190 in accordance with the invention. In this embodiment, the gas conditioning system 190 includes a temperature control system 320 carried by the door 176. The temperature control system 320 can be an electrical element, a fluid passageway for a heated fluid, an infrared element, or another type of device for maintaining a desired temperature at the second end 172 of the passageway 170. The temperature control system 320 can further include leads or fluid lines 322 that run through the shaft 181. In operation, the temperature control system 320 typically heats the door 176 to maintain a temperature at the second end 172 of the passageway 170 at which the precursor gases do not adsorp to the walls of the passageway 170 or the door 176. One advantage of the particular embodiment of the gas conditioning system 190 shown in FIG. 6 is that by precisely controlling the temperature at the second end 172 of the passageway 170, adsorption and/or desorption of gases in the passageway 170 is reduced in a manner that is expected to provide higher quality films on workpieces.

[0033] FIG. 7 illustrates another embodiment of the gas conditioning system 190 including the secondary gas passage 202, the plate 204 with the flow ports 206, and the temperature control system 320 in the door 176. The flow ports 206 and the temperature control system 320 can be similar to the components described above with reference to FIGS. 5 and 6. In the embodiment shown in FIG. 7, however, these two features operate together to maintain a desired concentration and phase of gas constituents in the passageway 170. As with the embodiments show in FIGS. 5 and 6, this embodiment is expected to (a) mitigate contamination of the workpiece W (FIG. 4) as it passes through the passageway 170 and (b) enhance the quality of the film deposited on the workpiece.

[0034] FIGS. 8-10 are cross-sectional views illustrating additional embodiments of reactors with gas conditioning systems. Like reference numbers refer to like components in FIGS. 5-7 and 8-10, and thus specific details of components described above are not repeated.

[0035] FIG. 8 is a cross-sectional view of a gas conditioning system 800 including a plurality of flow ports 810 in the wall of the passageway 170 and a secondary gas passage 812. A secondary gas passes through the secondary gas passage 812 and flows through the flow ports 810 into the second end 172 of the passageway 170. FIG. 9 is a cross-sectional view of another embodiment of a gas conditioning system 900 including a temperature control system 920 in or at the wall of the passageway 170 rather than the door 176. In this embodiment, the temperature control system 920 is a heating element positioned in the wall of the passageway 170 near the second end 172 of the passageway 170. The temperature control system 920 can be an electrical or fluid system that has leads or fluid lines 922. FIG. 10 is a cross-sectional view of a gas control system 1000 that includes a temperature control system 920 and flow ports 810 in or at the wall near the second end 172 of the passageway 170. The flow ports 810 and temperature control system 920 of this embodiment can operate as described above with reference to embodiments shown in FIGS. 8 and 9.

[0036] From the foregoing, it will be appreciated that specific embodiments of the invention have been described herein for purposes of illustration, but that various modifications may be made without deviating from the spirit and scope of the invention. For example, any of the embodiments shown in FIGS. 5-7 can be combined with one or more of those shown in FIGS. 8-10. As such, the gas conditioning system can have one heating element or a set of flow ports in the door and/or another heating element or another set of flow ports in the wall at the second end of the passageway. Accordingly, the invention is not limited except as by the appended claims.